Diagnosing inertial confinement fusion gamma ray physics (invited)

2010 ◽  
Vol 81 (10) ◽  
pp. 10D333 ◽  
Author(s):  
H. W. Herrmann ◽  
N. Hoffman ◽  
D. C. Wilson ◽  
W. Stoeffl ◽  
L. Dauffy ◽  
...  
2019 ◽  
Vol 90 (11) ◽  
pp. 113503 ◽  
Author(s):  
K. D. Meaney ◽  
Y. H. Kim ◽  
H. W. Herrmann ◽  
H. Geppert-Kleinrath ◽  
N. M. Hoffman

2013 ◽  
Vol 20 (4) ◽  
pp. 042705 ◽  
Author(s):  
N. M. Hoffman ◽  
H. W. Herrmann ◽  
Y. H. Kim ◽  
H. H. Hsu ◽  
C. J. Horsfield ◽  
...  

2010 ◽  
Vol 81 (10) ◽  
pp. 10D332 ◽  
Author(s):  
N. M. Hoffman ◽  
D. C. Wilson ◽  
H. W. Herrmann ◽  
C. S. Young

2013 ◽  
Vol 27 (30) ◽  
pp. 1350151
Author(s):  
S. SON ◽  
SUNG JOON MOON

A theory for instability in the long-time limit, arising from the electron gyro-motion in strongly magnetized plasmas, is presented. The analysis of the electron motion in the presence of a strong magnetic field leads to a theoretical framework similar to that of the Landau damping. Various electromagnetic modes are predicted to be possibly unstable, and the regime where the radiation from this instability would stand out, compared to the incoherent electron–cyclotron radiation, is identified. This instability would be relevant to the inertial confinement fusion and the gamma ray burst.


Author(s):  
C. W. Price ◽  
E. F. Lindsey

Thickness measurements of thin films are performed by both energy-dispersive x-ray spectroscopy (EDS) and x-ray fluorescence (XRF). XRF can measure thicker films than EDS, and XRF measurements also have somewhat greater precision than EDS measurements. However, small components with curved or irregular shapes that are used for various applications in the the Inertial Confinement Fusion program at LLNL present geometrical problems that are not conducive to XRF analyses but may have only a minimal effect on EDS analyses. This work describes the development of an EDS technique to measure the thickness of electroless nickel deposits on gold substrates. Although elaborate correction techniques have been developed for thin-film measurements by x-ray analysis, the thickness of electroless nickel films can be dependent on the plating bath used. Therefore, standard calibration curves were established by correlating EDS data with thickness measurements that were obtained by contact profilometry.


2020 ◽  
Vol 36 ◽  
pp. 100749 ◽  
Author(s):  
R.E. Olson ◽  
R.J. Leeper ◽  
S.H. Batha ◽  
R.R. Peterson ◽  
P.A. Bradley ◽  
...  

2021 ◽  
Vol 28 (3) ◽  
pp. 032713
Author(s):  
Dongguo Kang ◽  
Huasen Zhang ◽  
Shiyang Zou ◽  
Wudi Zheng ◽  
Shaoping Zhu ◽  
...  

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