scholarly journals Lateral signals in piezoresponse force microscopy at domain boundaries of ferroelectric crystals

2010 ◽  
Vol 97 (10) ◽  
pp. 102902 ◽  
Author(s):  
Florian Johann ◽  
Tobias Jungk ◽  
Martin Lilienblum ◽  
Ákos Hoffmann ◽  
Elisabeth Soergel
Keyword(s):  
Piezoresponse Force Microscopy ◽  
Force Microscopy ◽  
Ferroelectric Crystals ◽  
Domain Boundaries

Local electromechanical properties of ZnO thin films and micro crystals

2010 ◽  
Vol 1256 ◽  
Author(s):  
Igor Bdikin ◽  
Maxim Silibin ◽  
Rachid Ayouchi ◽  
R Schwarz ◽  
Sergei Gavrilov ◽  
...  
Keyword(s):  
Thin Films ◽  
Piezoresponse Force Microscopy ◽  
Hexagonal Structure ◽  
Electromechanical Properties ◽  
Force Microscopy ◽  
Topographic Features ◽  
Plane Analysis ◽  
Zinc Oxide Films ◽  
Domain Boundaries ◽  
Out Of Plane

AbstractHigh-resolution piezoresponse force microscopy (PFM) was used to measure the out-of-plane (effective longtitudinal) and in-plane (effective shear) piezoresponse of zinc oxide films and microrods. Thin films were deposited by pulsed laser deposition (PLD) and micro rods formed from solution. Measurements of three components of piezoresponse, one out-of-plane (OPP) and two in-plane (IPP) signals, allowed the construction of 3D piezoelectric maps reflecting the polycrystalline nature of the films. Both the IPP and OPP piezoresponse signal distributions are analyzed based on the particular texture of the films. It was observed that the central part of microrods contains polarization inversion with head-to-head ferroelectric-like domains. The as-grown domain boundaries were always parallel to the (0001) basal plane. Analysis of the PFM piezoresponse images was done based on the hexagonal structure of ZnO and topographic features along the hexagonal axis.

In-plane polarization contribution to the vertical piezoresponse force microscopy signal mediated by the cantilever “buckling”

2021 ◽  
Vol 543 ◽  
pp. 148808
Author(s):  
D.O. Alikin ◽  
L.V. Gimadeeva ◽  
A.V. Ankudinov ◽  
Q. Hu ◽  
V.Ya. Shur ◽  
...  
Keyword(s):  
Piezoresponse Force Microscopy ◽  
Force Microscopy ◽  
Polarization Contribution

Characterization of Nanomechanical, Ferroelectric, and Piezoelectric Properties by Nanoindentation and Piezoresponse Force Microscopy of PbTiO3 Thin Films

2013 ◽  
Vol 52 (40) ◽  
pp. 14328-14334 ◽  
Author(s):  
Juan Ramos-Cano ◽  
Mario Miki-Yoshida ◽  
André Marino Gonçalves ◽  
José Antônio Eiras ◽  
Jesús González-Hernández ◽  
...  
Keyword(s):  
Thin Films ◽  
Piezoelectric Properties ◽  
Piezoresponse Force Microscopy ◽  
Force Microscopy ◽  
Ferroelectric And Piezoelectric Properties

Effect of Diamagnetic A2+ Substitution on the Magnetic and Ferroelectric Properties of the Bi1−xAxFeO3 Multiferroics

2007 ◽  
Vol 1034 ◽  
Author(s):  
V. A. Khomchenko ◽  
D. A. Kiselev ◽  
J. M. Vieira ◽  
Li Jian ◽  
A. M. L. Lopes ◽  
...  
Keyword(s):  
Spin Structure ◽  
Ionic Radius ◽  
Ferroelectric Properties ◽  
Piezoresponse Force Microscopy ◽  
Weak Ferromagnetism ◽  
Force Microscopy ◽  
Microscopy Data ◽  
A Site ◽  
Induced Changes ◽  
Spiral Spin

AbstractInvestigation of crystal structure, magnetic and local ferroelectric properties of the diamagnetically-doped Bi1−xAxFeO3 (A= Ca, Sr, Pb, Ba; x= 0.2, 0.3) ceramic samples has been carried out. It has been shown that the solid solutions have a rhombohedrally distorted perovskite structure described by the space group R3c. Piezoresponse force microscopy data have revealed the existence of the spontaneous ferroelectric polarization in the samples at room temperature. Magnetization measurements have shown that the magnetic state of these compounds is determined by the ionic radius of the substituting elements. A-site substitution with the biggest ionic radius ions has been found to suppress the spiral spin structure of BiFeO3 and to result in the appearance of weak ferromagnetism. The magnetic properties have been discussed in terms of doping- induced changes in the magnetic anisotropy.

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