Pulsed laser‐induced electron and positive‐ion emission from Cu(100) under ultrahigh‐vacuum conditions near the threshold for surface damage

1991 ◽  
Vol 69 (6) ◽  
pp. 3472-3479 ◽  
Author(s):  
Paul G. Strupp ◽  
Peter C. Stair ◽  
Eric Weitz
Keyword(s):  
Pulsed Laser ◽  
Ultrahigh Vacuum ◽  
Surface Damage ◽  
Ion Emission ◽  
Positive Ion

Ion and Electron Spectroscopy During Pulsed Laser Irradiation of Silicon

1983 ◽  
Vol 13 ◽  
Author(s):  
J.P. Long ◽  
R.T. Williams ◽  
T.R. Royt ◽  
J.C. Rife ◽  
M.N. Kabler
Keyword(s):  
Alkali Metals ◽  
Laser Annealing ◽  
Thermal Evaporation ◽  
Pulsed Laser ◽  
Silicon Surfaces ◽  
Energy Distributions ◽  
Electrons And Ions ◽  
Ion Emission ◽  
Positive Ion ◽  
Pulsed Laser Irradiation

ABSTRACTIon mass spectrometry, charged particle yields, and kinetic energy distributions of electrons and ions are used to characterize silicon wafers and vacuum-cleaved silicon surfaces under conditions related to laser annealing. We find that alkali metals dominate the positive ion emission from chemically-cleaned wafers, a mass-72 peak tentatively identified as Si2O+ comprises the main ion emission from the cleaved surface, and ion and electron temperatures can be derived from the energy distribution curves although the Si2O+ emission implies more than a simple thermal evaporation process.

scholarly journals Layer-by-Layer Pyramid Formation from Low-Energy Ar+ Bombardment and Annealing of Ge (110)

Nanomaterials ◽  
2021 ◽  
Vol 11 (10) ◽  
pp. 2521
Author(s):  
Marshall van Zijll ◽  
Samantha S. Spangler ◽  
Andrew R. Kim ◽  
Hazel R. Betz ◽  
Shirley Chiang
Keyword(s):  
Scanning Tunneling Microscopy ◽  
Ultrahigh Vacuum ◽  
Surface Damage ◽  
Low Energy ◽  
Scanning Tunneling ◽  
Layer By Layer ◽  
Sample Holder ◽  
Tunneling Microscopy ◽  
Ion Energies ◽  
20 Nm

Isolated pyramids, 30–80 nm wide and 3–20 nm tall, form during sputter-annealing cycles on the Ge (110) surface. Pyramids have four walls with {19 13 1} faceting and a steep mound at the apex. We used scanning tunneling microscopy (STM) under ultrahigh vacuum conditions to periodically image the surface at ion energies between 100 eV and 500 eV and incremental total flux. Pyramids are seen using Ar+ between 200 eV and 400 eV, and require Ag to be present on the sample or sample holder. We suspect that the pyramids are initiated by Ag co-sputtered onto the surface. Growth of pyramids is due to the gathering of step edges with (16 × 2) reconstruction around the pyramid base during layer-by-layer removal of the substrate, and conversion to {19 13 1} faceting. The absence of pyramids using Ar+ energies above 400 eV is likely due to surface damage that is insufficiently annealed.

The role of defects in laser induced positive ion emission from ionic crystals

1996 ◽  
Vol 96-98 ◽  
pp. 316-320 ◽  
Author(s):  
J.T. Dickinson ◽  
J.-J. Shin ◽  
S.C. Langford
Keyword(s):  
Ionic Crystals ◽  
Ion Emission ◽  
Positive Ion

Features of Vanadium-Surface Damage Induced by Pulsed Laser Radiation

2020 ◽  
Vol 14 (3) ◽  
pp. 484-489
Author(s):  
I. V. Borovitskaya ◽  
S. N. Korshunov ◽  
A. N. Mansurova ◽  
A. B. Mikhailova ◽  
V. V. Paramonova ◽  
...  
Keyword(s):  
Laser Radiation ◽  
Pulsed Laser ◽  
Surface Damage ◽  
Pulsed Laser Radiation

Positive‐ion emission from the fracture of fused silica

1989 ◽  
Vol 7 (3) ◽  
pp. 1829-1834 ◽  
Author(s):  
S. C. Langford ◽  
J. T. Dickinson ◽  
L. C. Jensen ◽  
L. R. Pederson
Keyword(s):  
Fused Silica ◽  
Ion Emission ◽  
Positive Ion

Positive Ion Emission from Nickel

1940 ◽  
Vol 57 (4) ◽  
pp. 335-335 ◽  
Author(s):  
G. A. Jarvis
Keyword(s):  
Ion Emission ◽  
Positive Ion
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