An investigation of the Pd‐In‐Ge nonspiking Ohmic contact ton‐GaAs using transmission line measurement, Kelvin, and Cox and Strack structures

L. C. Wang; X. Z. Wang; S. N. Hsu; S. S. Lau; P. S. D. Lin; T. Sands; S. A. Schwarz; D. L. Plumton; T. F. Kuech

doi:10.1063/1.348360

An investigation of the Pd‐In‐Ge nonspiking Ohmic contact ton‐GaAs using transmission line measurement, Kelvin, and Cox and Strack structures

Journal of Applied Physics ◽

10.1063/1.348360 ◽

1991 ◽

Vol 69 (8) ◽

pp. 4364-4372 ◽

Cited By ~ 44

Author(s):

L. C. Wang ◽

X. Z. Wang ◽

S. N. Hsu ◽

S. S. Lau ◽

P. S. D. Lin ◽

...

Keyword(s):

Transmission Line ◽

Ohmic Contact ◽

Line Measurement ◽

Transmission Line Measurement

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A novel de-embedding method suitable for transmission-line measurement

2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) ◽

10.1109/apemc.2015.7175313 ◽

2015 ◽

Cited By ~ 20

Author(s):

Bichen Chen ◽

Xiaoning Ye ◽

Bill Samaras ◽

Jun Fan

Keyword(s):

Transmission Line ◽

Embedding Method ◽

Line Measurement ◽

Transmission Line Measurement

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Transmission Line Measurement for Characterization of New Textile Sample

2019 IEEE Asia-Pacific Conference on Applied Electromagnetics (APACE) ◽

10.1109/apace47377.2019.9020821 ◽

2019 ◽

Author(s):

Nurul Huda Abd Rahman ◽

Yoshihide Yamada ◽

Mohd Shauqi Zulkipli ◽

Muhammad Shakir Amin Nordin

Keyword(s):

Transmission Line ◽

Line Measurement ◽

Transmission Line Measurement

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On-wafer passives de-embedding based on open-pad and Transmission Line measurement

2010 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) ◽

10.1109/bipol.2010.5667930 ◽

2010 ◽

Cited By ~ 1

Author(s):

A. Hamidipour ◽

M. Jahn ◽

F. Starzer ◽

X. Wang ◽

A. Stelzer

Keyword(s):

Transmission Line ◽

Line Measurement ◽

Transmission Line Measurement

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Permittivity characterization from transmission-line measurement

1997 IEEE MTT-S International Microwave Symposium Digest ◽

10.1109/mwsym.1997.596577 ◽

2002 ◽

Cited By ~ 19

Author(s):

M.D. Janezic ◽

D.F. Williams

Keyword(s):

Transmission Line ◽

Line Measurement ◽

Transmission Line Measurement

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A new electro-optical transmission-line measurement-method revealing a possible contribution of source and drain contact resistances to GaN HEMT dynamic on-resistance

Microelectronics Reliability ◽

10.1016/j.microrel.2018.07.119 ◽

2018 ◽

Vol 88-90 ◽

pp. 406-410

Author(s):

D. Hachem ◽

D. Trémouilles ◽

F. Morancho ◽

G. Toulon

Keyword(s):

Transmission Line ◽

Measurement Method ◽

Optical Transmission ◽

Gan Hemt ◽

Line Measurement ◽

Transmission Line Measurement

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Transmission Line Measurement of Electron Paramagnetic Resonance Frequency

American Journal of Physics ◽

10.1119/1.1986150 ◽

1971 ◽

Vol 39 (3) ◽

pp. 351-351

Author(s):

Roy Olson

Keyword(s):

Electron Paramagnetic Resonance ◽

Transmission Line ◽

Resonance Frequency ◽

Paramagnetic Resonance ◽

Line Measurement ◽

Electron Paramagnetic ◽

Transmission Line Measurement

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Determining interfacial resistance in thermoelectrochemical cells using transmission line measurement

Applied Physics Letters ◽

10.1063/5.0051249 ◽

2021 ◽

Vol 118 (24) ◽

pp. 243907

Author(s):

Ziwen Zhao ◽

Vikas Nandal ◽

Akiko Shun ◽

Lixian Jiang ◽

Shohei Horike ◽

...

Keyword(s):

Transmission Line ◽

Interfacial Resistance ◽

Line Measurement ◽

Transmission Line Measurement

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Transmission line measurement of gold contact on the arsenic-ion-implanted GaAs after rapid thermal annealing

10.1117/12.405395 ◽

2000 ◽

Cited By ~ 1

Author(s):

Gong-Ru Lin ◽

Jui L. Chang

Keyword(s):

Transmission Line ◽

Thermal Annealing ◽

Rapid Thermal Annealing ◽

Line Measurement ◽

Gold Contact ◽

Transmission Line Measurement ◽

Ion Implanted

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Experimentally Determining the Top and Edge Contact Resistivities of Two-Step Sulfurization Nb-Doped MoS2 Films Using the Transmission Line Measurement

IEEE Electron Device Letters ◽

10.1109/led.2019.2935538 ◽

2019 ◽

Vol 40 (10) ◽

pp. 1662-1665

Author(s):

Yun-Yan Chung ◽

Chi-Feng Li ◽

Chao-Ting Lin ◽

Yen-Teng Ho ◽

Chao-Hsin Chien

Keyword(s):

Transmission Line ◽

Edge Contact ◽

Line Measurement ◽

Contact Resistivities ◽

Transmission Line Measurement

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Reproducibility of transmission line measurement of bipolar I-V characteristics of MOSFETs

IEEE Transactions on Instrumentation and Measurement ◽

10.1109/19.772206 ◽

1999 ◽

Vol 48 (3) ◽

pp. 721-723 ◽

Cited By ~ 4

Author(s):

T.P. Chen ◽

R. Chan ◽

S. Fung ◽

K.F. Lo

Keyword(s):

Transmission Line ◽

Line Measurement ◽

Transmission Line Measurement

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