Determination of Single Microcrystalline Silicon Grains Preferential Crystallographic Orientation by Polarized Raman spectroscopy

2010 ◽  
Author(s):  
Martin Ledinský ◽  
Aliaksei Vetushka ◽  
Jiří Stuchlík ◽  
Antonín Fejfar ◽  
Jan Kočka ◽  
...  
2020 ◽  
Vol 5 (2) ◽  
pp. 308-315 ◽  
Author(s):  
Yun Choi ◽  
Keunui Kim ◽  
Soo Yeon Lim ◽  
Jungcheol Kim ◽  
Je Myoung Park ◽  
...  

Polarized Raman spectroscopy on few-layer ReS2 and ReSe2 was carried out to determine the crystallographic orientations.


2010 ◽  
Vol 96 (21) ◽  
pp. 213108 ◽  
Author(s):  
Myung Hwa Kim ◽  
Jeong Min Baik ◽  
Seung Joon Lee ◽  
Hae-Young Shin ◽  
Jaeyeon Lee ◽  
...  

Nanoscale ◽  
2015 ◽  
Vol 7 (44) ◽  
pp. 18708-18715 ◽  
Author(s):  
Jungcheol Kim ◽  
Jae-Ung Lee ◽  
Jinhwan Lee ◽  
Hyo Ju Park ◽  
Zonghoon Lee ◽  
...  

Crystallographic direction of black phosphorus can be determined from polarized optical microscopy and polarized Raman spectroscopy.


2D Materials ◽  
2016 ◽  
Vol 3 (3) ◽  
pp. 034004 ◽  
Author(s):  
Minjung Kim ◽  
Songhee Han ◽  
Jung Hwa Kim ◽  
Jae-Ung Lee ◽  
Zonghoon Lee ◽  
...  

Carbon ◽  
2015 ◽  
Vol 88 ◽  
pp. 215-224 ◽  
Author(s):  
Zheling Li ◽  
Robert J. Young ◽  
Ian A. Kinloch ◽  
Neil R. Wilson ◽  
Alexander J. Marsden ◽  
...  

2017 ◽  
Vol 27 (14) ◽  
pp. 1604799 ◽  
Author(s):  
Junyong Wang ◽  
Xin Luo ◽  
Shisheng Li ◽  
Ivan Verzhbitskiy ◽  
Weijie Zhao ◽  
...  

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