scholarly journals Thickness measurement of thin films by x‐ray absorption

1991 ◽  
Vol 69 (1) ◽  
pp. 499-501 ◽  
Author(s):  
J. Chaudhuri ◽  
S. Shah
Keyword(s):  
Thin Films ◽  
Thickness Measurement ◽  
X Ray ◽  
X Ray Absorption

Accounting for Secondary Extinction in Thickness Measurement of Thin Films by X-Ray Absorption

2005 ◽  
Vol 495-497 ◽  
pp. 99-104
Author(s):  
I. Tomov
Keyword(s):  
Thin Films ◽  
Incident Beam ◽  
Thickness Measurement ◽  
Fair Agreement ◽  
Transmission Factor ◽  
Absorption Method ◽  
X Ray ◽  
Cu Films ◽  
Secondary Extinction ◽  
X Ray Absorption

Allowing for secondary extinction (SE), a method is described for thickness measurement of thin films by x-ray absorption. The method is tested by employing Al foils and electrodeposited Cu films detached by the substrate. The thicknesses determined by the method were in fair agreement with that ones measured by the ordinary absorption method based on using incident beam intensities. Moreover, a dependence of the SE coefficient on the transmission factor of the films was experimentally shown, and thus additional light was thrown on the nature of SE.

scholarly journals Thickness Measurement of Thin Films by X-Ray Absorption

1989 ◽  
Vol 161 ◽  
Author(s):  
J. Chaudhuri ◽  
S. Shah
Keyword(s):  
Thin Films ◽  
Single Crystal ◽  
Diffraction Method ◽  
Thickness Measurement ◽  
Single Crystal Substrate ◽  
X Ray Diffraction ◽  
X Ray ◽  
Crystal Substrate ◽  
Crystal Model ◽  
X Ray Absorption

ABSTRACTAn x-ray diffraction method is described for determining thicknesses of thin films grown on single crystal substrates. The equations, based on the kinematical theory of x-ray diffraction and the mosaic crystal model, were developed. The thickness of the thin film was computed from the absorption of the integrated diffracted x-ray intensity from the single crystal substrate by the film. Since the diffracted intensity from the film is not required, the film does not have to be single crystal in nature. Thus, thicknesses of less ordered, polycrystalline or even amorphous films can be measured with high precision by this technique.

Structure of magnetic thin films and nanostructures studied by extended X-ray absorption fine structure

2000 ◽  
Vol 454-456 ◽  
pp. 723-728 ◽  
Author(s):  
H. Magnan ◽  
P. Le Fèvre ◽  
A. Midoir ◽  
D. Chandesris ◽  
H. Jaffrès ◽  
...  
Keyword(s):  
Thin Films ◽  
Fine Structure ◽  
Magnetic Thin Films ◽  
X Ray ◽  
Absorption Fine ◽  
X Ray Absorption

X-ray Absorption Study of Epitaxial LaNiO[sub 3] Thin Films

2011 ◽  
Author(s):  
Yogesh Kumar ◽  
Abhinav Pratap Singh ◽  
P. Thakur ◽  
Ravi Kumar ◽  
Alka B. Garg ◽  
...  
Keyword(s):  
Thin Films ◽  
Absorption Study ◽  
X Ray ◽  
X Ray Absorption

scholarly journals X-ray absorption spectroscopy elucidates the impact of structural disorder on electron mobility in amorphous zinc-tin-oxide thin films

2014 ◽  
Vol 104 (24) ◽  
pp. 242113 ◽  
Author(s):  
Sin Cheng Siah ◽  
Sang Woon Lee ◽  
Yun Seog Lee ◽  
Jaeyeong Heo ◽  
Tomohiro Shibata ◽  
...  
Keyword(s):  
Thin Films ◽  
Absorption Spectroscopy ◽  
Tin Oxide ◽  
Electron Mobility ◽  
Structural Disorder ◽  
Oxide Thin Films ◽  
X Ray ◽  
Zinc Tin Oxide ◽  
The Impact ◽  
X Ray Absorption

X-ray absorption and X-ray photoelectron spectroscopic studies of air-oxidized chromium nitride thin films

1996 ◽  
Vol 281-282 ◽  
pp. 314-317 ◽  
Author(s):  
F. Esaka ◽  
H. Shimada ◽  
M. Imamura ◽  
N. Matsubayashi ◽  
T. Sato ◽  
...  
Keyword(s):  
Thin Films ◽  
Spectroscopic Studies ◽  
Chromium Nitride ◽  
X Ray ◽  
X Ray Absorption
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