Nanoscale chemical imaging using synchrotron x-ray enhanced scanning tunneling microscopy

Author(s):  
Volker Rose ◽  
John W. Freeland ◽  
R. Garrett ◽  
I. Gentle ◽  
K. Nugent ◽  
...  
2009 ◽  
Vol 102 (10) ◽  
Author(s):  
Taichi Okuda ◽  
Toyoaki Eguchi ◽  
Kotone Akiyama ◽  
Ayumi Harasawa ◽  
Toyohiko Kinoshita ◽  
...  

Author(s):  
H.-J. Cantow ◽  
H. Hillebrecht ◽  
S. Magonov ◽  
H. W. Rotter ◽  
G. Thiele

From X-ray analysis, the conclusions are drawn from averaged molecular informations. Thus, limitations are caused when analyzing systems whose symmetry is reduced due to interatomic interactions. In contrast, scanning tunneling microscopy (STM) directly images atomic scale surface electron density distribution, with a resolution up to fractions of Angstrom units. The crucial point is the correlation between the electron density distribution and the localization of individual atoms, which is reasonable in many cases. Thus, the use of STM images for crystal structure determination may be permitted. We tried to apply RuCl3 - a layered material with semiconductive properties - for such STM studies. From the X-ray analysis it has been assumed that α-form of this compound crystallizes in the monoclinic space group C2/m (AICI3 type). The chlorine atoms form an almost undistorted cubic closed package while Ru occupies 2/3 of the octahedral holes in every second layer building up a plane hexagon net (graphite net). Idealizing the arrangement of the chlorines a hexagonal symmetry would be expected. X-ray structure determination of isotypic compounds e.g. IrBr3 leads only to averaged positions of the metal atoms as there exist extended stacking faults of the metal layers.


2001 ◽  
Vol 89 (1) ◽  
pp. 181-187 ◽  
Author(s):  
C. M. Schmidt ◽  
D. E. Bürgler ◽  
D. M. Schaller ◽  
F. Meisinger ◽  
H.-J. Güntherodt ◽  
...  

1994 ◽  
Vol 50 (16) ◽  
pp. 12246-12249 ◽  
Author(s):  
J. C. Woicik ◽  
G. E. Franklin ◽  
Chien Liu ◽  
R. E. Martinez ◽  
I.-S. Hwong ◽  
...  

2015 ◽  
Vol 1754 ◽  
pp. 135-140 ◽  
Author(s):  
Nozomi Shirato ◽  
Marvin Cummings ◽  
Heath Kersell ◽  
Yang Li ◽  
Dean Miller ◽  
...  

ABSTRACTX-ray beam-induced damage in nanoscale metal islands was investigated. Monolayer-high Ni islands were prepared on a Cu(111) substrate. High brilliance X-rays with photon energies between 8.45 and 8.85 keV illuminated the sample for about 11 hours. In order to track changes in the morphology of the islands, the synchrotron X-ray scanning tunneling microscopy (SX-STM) technique was utilized. The result shows that X-ray illumination onto Ni islands does not induce noticeable damage. The study demonstrates that local beam-induced changes can be studied using SX-STM.


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