Microanalysis on the (200) diffraction intensity to determine the Al concentrations for AlGaAs‐GaAs multiple‐quantum‐well structures
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1987 ◽
Vol 48
(C5)
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pp. C5-457-C5-461
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2017 ◽
Vol 17
(3)
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pp. 398-402
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1992 ◽
Vol 199
(6)
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pp. 621-624
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