Erratum: ‘‘X‐ray and Raman characterization of AlSb/GaSb strained layer superlattices and quasiperiodic Fibonacci lattices’’ [J. Appl. Phys. 64, 6733 (1988)]

A. T. Macrander; G. P. Schwartz; G. J. Gualtieri

doi:10.1063/1.344504

Erratum: ‘‘X‐ray and Raman characterization of AlSb/GaSb strained layer superlattices and quasiperiodic Fibonacci lattices’’ [J. Appl. Phys. 64, 6733 (1988)]

Journal of Applied Physics ◽

10.1063/1.344504 ◽

1989 ◽

Vol 66 (8) ◽

pp. 3963-3963

Author(s):

A. T. Macrander ◽

G. P. Schwartz ◽

G. J. Gualtieri

Keyword(s):

X Ray ◽

Strained Layer ◽

Strained Layer Superlattices ◽

Raman Characterization

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X‐ray and Raman characterization of AlSb/GaSb strained layer superlattices and quasiperiodic Fibonacci lattices

Journal of Applied Physics ◽

10.1063/1.342005 ◽

1988 ◽

Vol 64 (12) ◽

pp. 6733-6745 ◽

Cited By ~ 44

Author(s):

A. T. Macrander ◽

G. P. Schwartz ◽

G. J. Gualtieri

Keyword(s):

X Ray ◽

Strained Layer ◽

Strained Layer Superlattices ◽

Raman Characterization

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X‐ray characterization of (Zn,Cd)Te/CdTe strained layer superlattices

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.577555 ◽

1991 ◽

Vol 9 (3) ◽

pp. 954-956

Author(s):

Syed B. Qadri

Keyword(s):

X Ray ◽

Strained Layer ◽

Strained Layer Superlattices

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X‐ray characterization of strain relaxation in InGaAs/GaAs strained‐layer superlattices

Applied Physics Letters ◽

10.1063/1.110190 ◽

1993 ◽

Vol 63 (24) ◽

pp. 3327-3329 ◽

Cited By ~ 4

Author(s):

Jianhua Li ◽

Zhenhong Mai ◽

Shufan Cui ◽

Junming Zhou ◽

Wei Feng

Keyword(s):

Strain Relaxation ◽

X Ray ◽

Strained Layer ◽

Strained Layer Superlattices

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Convergent-beam electron diffraction and X-ray diffraction characterization of strained-layer superlattices

Ultramicroscopy ◽

10.1016/0304-3991(91)90129-t ◽

1991 ◽

Vol 36 (4) ◽

pp. 375-384 ◽

Cited By ~ 13

Author(s):

X.F. Duan ◽

K.K. Fung

Keyword(s):

Electron Diffraction ◽

Convergent Beam Electron Diffraction ◽

X Ray Diffraction ◽

Beam Electron ◽

X Ray ◽

Strained Layer ◽

Strained Layer Superlattices ◽

Convergent Beam

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Characterization of InxGa1−xAs/GaAs strained layer superlattices by ion backscattering-channeling and X-ray diffraction

phys stat sol (a) ◽

10.1002/pssa.2211070151 ◽

1988 ◽

Vol 107 (1) ◽

pp. K19-K24 ◽

Cited By ~ 7

Author(s):

R. Flagmeyer ◽

K. Lenkeit ◽

T. Baumbach ◽

Yu. O. Kanter ◽

A. A. Fedorov

Keyword(s):

X Ray Diffraction ◽

X Ray ◽

Strained Layer ◽

Strained Layer Superlattices ◽

Ion Backscattering

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Characterization of Anomalous Lattice-Relaxation Process in InAsP/InGaAsP Strained Layer Superlattices by X-Ray Diffraction Measurements

InP and Related Compounds ◽

10.1201/9781482282986-18 ◽

2000 ◽

pp. 525-580

Keyword(s):

Relaxation Process ◽

Lattice Relaxation ◽

X Ray Diffraction ◽

X Ray ◽

Strained Layer ◽

Strained Layer Superlattices

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Molecular‐beam epitaxial growth and x‐ray characterization of (Zn,Cd)Te/CdTe strained layer superlattices

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.575898 ◽

1989 ◽

Vol 7 (3) ◽

pp. 616-620 ◽

Cited By ~ 11

Author(s):

T. D. Golding ◽

S. B. Qadri ◽

J. H. Dinan

Keyword(s):

Epitaxial Growth ◽

Molecular Beam ◽

X Ray ◽

Strained Layer ◽

Molecular Beam Epitaxial ◽

Molecular Beam Epitaxial Growth ◽

Strained Layer Superlattices

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Estimation of the strain state of GexSi1−x/Si strained-layer superlattices by double-crystal X-ray diffraction

Journal of Crystal Growth ◽

10.1016/0022-0248(94)90099-x ◽

1994 ◽

Vol 141 (1-2) ◽

pp. 103-108

Author(s):

X.F. Duan ◽

K.K. Fung ◽

Y.M. Chu

Keyword(s):

Strain State ◽

X Ray Diffraction ◽

Double Crystal ◽

X Ray ◽

Strained Layer ◽

Strained Layer Superlattices

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Kinematical simulation of high‐resolution x‐ray diffraction curves of GexSi1−x/Si strained‐layer superlattices: A structural assessment

Applied Physics Letters ◽

10.1063/1.99189 ◽

1988 ◽

Vol 52 (14) ◽

pp. 1152-1154 ◽

Cited By ~ 29

Author(s):

J. M. Vandenberg ◽

J. C. Bean ◽

R. A. Hamm ◽

R. Hull

Keyword(s):

High Resolution ◽

X Ray Diffraction ◽

Structural Assessment ◽

X Ray ◽

Strained Layer ◽

Strained Layer Superlattices ◽

Kinematical Simulation

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Characterization of the interface of ZnSe-ZnS strained-layer superlattices by MeV transmission electron microscopy and ion-channeling

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/0168-583x(88)90640-4 ◽

1988 ◽

Vol 33 (1-4) ◽

pp. 603-606 ◽

Cited By ~ 10

Author(s):

Kawakami Yoichi ◽

Taguchi Tsunemasa ◽

Satou Mamoru ◽

Hiraki Akio

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Strained Layer ◽

Ion Channeling ◽

Transmission Electron ◽

Strained Layer Superlattices

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