Initial epitaxial growth of copper silicide on Si{111} studied by low‐energy electron microscopy and photoemission electron microscopy

1989 ◽  
Vol 65 (12) ◽  
pp. 4747-4752 ◽  
Author(s):  
M. Mundschau ◽  
E. Bauer ◽  
W. Telieps ◽  
W. Świȩch
Keyword(s):  
Electron Microscopy ◽  
Epitaxial Growth ◽  
Low Energy ◽  
Energy Electron ◽  
Copper Silicide ◽  
Photoemission Electron Microscopy ◽  
Low Energy Electron ◽  
Photoemission Electron

scholarly journals The EIGER detector for low-energy electron microscopy and photoemission electron microscopy

2017 ◽  
Vol 24 (5) ◽  
pp. 963-974 ◽  
Author(s):  
G. Tinti ◽  
H. Marchetto ◽  
C. A. F. Vaz ◽  
A. Kleibert ◽  
M. Andrä ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Dynamic Range ◽  
Single Photon ◽  
Low Energy ◽  
Energy Electron ◽  
Frame Rate ◽  
Pixel Detector ◽  
Photoemission Electron Microscopy ◽  
Low Energy Electron ◽  
Photoemission Electron

EIGER is a single-photon-counting hybrid pixel detector developed at the Paul Scherrer Institut, Switzerland. It is designed for applications at synchrotron light sources with photon energies above 5 keV. Features of EIGER include a small pixel size (75 µm × 75 µm), a high frame rate (up to 23 kHz), a small dead-time between frames (down to 3 µs) and a dynamic range up to 32-bit. In this article, the use of EIGER as a detector for electrons in low-energy electron microscopy (LEEM) and photoemission electron microscopy (PEEM) is reported. It is demonstrated that, with only a minimal modification to the sensitive part of the detector, EIGER is able to detect electrons emitted or reflected by the sample and accelerated to 8–20 keV. The imaging capabilities are shown to be superior to the standard microchannel plate detector for these types of applications. This is due to the much higher signal-to-noise ratio, better homogeneity and improved dynamic range. In addition, the operation of the EIGER detector is not affected by radiation damage from electrons in the present energy range and guarantees more stable performance over time. To benchmark the detector capabilities, LEEM experiments are performed on selected surfaces and the magnetic and electronic properties of individual iron nanoparticles with sizes ranging from 8 to 22 nm are detected using the PEEM endstation at the Surface/Interface Microscopy (SIM) beamline of the Swiss Light Source.

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