Rutherford backscattering spectroscopy studies of ion transport in anodic oxides of Al/GaAs

S. W. Teare; C. W. Fischer

doi:10.1063/1.342819

Rutherford backscattering spectroscopy studies of ion transport in anodic oxides of Al/GaAs

Journal of Applied Physics ◽

10.1063/1.342819 ◽

1989 ◽

Vol 65 (6) ◽

pp. 2479-2484 ◽

Cited By ~ 3

Author(s):

S. W. Teare ◽

C. W. Fischer

Keyword(s):

Ion Transport ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy ◽

Spectroscopy Studies

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Auger electron spectroscopy and Rutherford backscattering spectroscopy studies of TiN and TiC coatings prepared by the activated reactive evaporation process

Thin Solid Films ◽

10.1016/0040-6090(87)90178-7 ◽

1987 ◽

Vol 153 (1-3) ◽

pp. 149-157 ◽

Cited By ~ 13

Author(s):

N. Kaufherr ◽

G.R. Fenske ◽

D.E. Busch ◽

P. Lin ◽

C. Deshpandey ◽

...

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy ◽

Evaporation Process ◽

Reactive Evaporation ◽

Activated Reactive Evaporation ◽

Spectroscopy Studies

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High Resolution X-Ray Diffraction and Rutherford Backscattering Spectroscopy Studies on Laser Molecular Beam Epitaxy Grown GaN Layers on Sapphire (0001)

Advanced Science Letters ◽

10.1166/asl.2014.5540 ◽

2014 ◽

Vol 20 (7) ◽

pp. 1406-1409 ◽

Cited By ~ 3

Author(s):

M. Senthil Kumar ◽

S. S. Kushvaha ◽

K. K. Maurya ◽

K. Saravanan ◽

Sunil Ojha

Keyword(s):

High Resolution ◽

Molecular Beam Epitaxy ◽

Molecular Beam ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy ◽

X Ray Diffraction ◽

X Ray ◽

Laser Molecular Beam Epitaxy ◽

Spectroscopy Studies

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High resolution Rutherford backscattering spectroscopy studies on Mo/Si multilayers

Thin Solid Films ◽

10.1016/0040-6090(93)90564-6 ◽

1993 ◽

Vol 228 (1-2) ◽

pp. 60-63 ◽

Cited By ~ 7

Author(s):

B. Heidemann ◽

T. Tappe ◽

B. Schmiedeskamp ◽

U. Heinzmann

Keyword(s):

High Resolution ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy ◽

Spectroscopy Studies

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Rutherford backscattering spectroscopy and X-ray photoelectron spectroscopy studies of thin glass films prepared by laser evaporation

Thin Solid Films ◽

10.1016/0040-6090(90)90486-w ◽

1990 ◽

Vol 192 (1) ◽

pp. 149-156 ◽

Cited By ~ 11

Author(s):

E.E. Khawaja ◽

F.F. Al-Adel ◽

A.B. Hallak ◽

M.M. Al-Kofahi ◽

M.A. Salim

Keyword(s):

Photoelectron Spectroscopy ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy ◽

Laser Evaporation ◽

Thin Glass ◽

X Ray ◽

Spectroscopy Studies ◽

Glass Films

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Auger electron spectroscopy and Rutherford backscattering spectroscopy studies of TiN and TiC coatings prepared by the activated reactive evaporation process

Vacuum ◽

10.1016/0042-207x(89)90590-3 ◽

1989 ◽

Vol 39 (5) ◽

pp. 525-526

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy ◽

Evaporation Process ◽

Reactive Evaporation ◽

Activated Reactive Evaporation ◽

Spectroscopy Studies

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Rutherford backscattering spectroscopy of amorphous films of Ag–As–S system prepared by spin-coating technique

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/j.nimb.2004.01.180 ◽

2004 ◽

Vol 219-220 ◽

pp. 875-879 ◽

Cited By ~ 3

Author(s):

T. Wágner ◽

T. Kohoutek ◽

V. Perina ◽

A. Mackova ◽

V. Hnatowitz ◽

...

Keyword(s):

Spin Coating ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy ◽

Spin Coating Technique ◽

Amorphous Films ◽

Coating Technique

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Tungsten surface enrichment in EUROFER and Fe-W model systems studied by high-resolution time-of-flight rutherford backscattering spectroscopy

Nuclear Materials and Energy ◽

10.1016/j.nme.2018.10.004 ◽

2018 ◽

Vol 17 ◽

pp. 147-151 ◽

Cited By ~ 3

Author(s):

M. Mayer ◽

T.F. Silva ◽

R. Arredondo ◽

M. Balden ◽

I. Bogdanović-Radović ◽

...

Keyword(s):

High Resolution ◽

Time Of Flight ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy ◽

Model Systems ◽

Surface Enrichment ◽

Resolution Time ◽

Tungsten Surface

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Surface analysis of a GaAs electron source using Rutherford backscattering spectroscopy

Applied Physics Letters ◽

10.1063/1.112353 ◽

1994 ◽

Vol 65 (3) ◽

pp. 301-302 ◽

Cited By ~ 12

Author(s):

R. Calabrese ◽

V. Guidi ◽

P. Lenisa ◽

B. Maciga ◽

G. Ciullo ◽

...

Keyword(s):

Surface Analysis ◽

Electron Source ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy

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Surface structures of equimolar mixtures of imidazolium-based ionic liquids using high-resolution Rutherford backscattering spectroscopy

Surface Science ◽

10.1016/j.susc.2012.07.013 ◽

2012 ◽

Vol 606 (21-22) ◽

pp. 1693-1699 ◽

Cited By ~ 25

Author(s):

Kaoru Nakajima ◽

Shinichi Oshima ◽

Motofumi Suzuki ◽

Kenji Kimura

Keyword(s):

Ionic Liquids ◽

High Resolution ◽

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy ◽

Surface Structures

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Sorption Mechanism of Europium by Apatite Using Rutherford Backscattering Spectroscopy and Resonant Nuclear React ion Analysis

Journal of Nuclear Science and Technology ◽

10.1080/18811248.1997.9732056 ◽

1997 ◽

Vol 34 (1) ◽

pp. 58-62 ◽

Cited By ~ 8

Author(s):

Toshihiko OHNUKI ◽

Naofumi KOZAI ◽

Hiroshi ISOBE ◽

Takashi MURAKAMI ◽

Shunya YAMAMOTO ◽

...

Keyword(s):

Rutherford Backscattering ◽

Rutherford Backscattering Spectroscopy ◽

Sorption Mechanism ◽

Ion Analysis

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