A low temperature scanning tunneling microscopy system for measuring Si at 4.2 K

2010 ◽  
Vol 81 (5) ◽  
pp. 053703 ◽  
Author(s):  
Michael Dreyer ◽  
Jonghee Lee ◽  
Hui Wang ◽  
Barry Barker
2019 ◽  
Vol 30 (12) ◽  
pp. 2355-2358 ◽  
Author(s):  
Qiang Xue ◽  
Yajie Zhang ◽  
Ruoning Li ◽  
Chao Li ◽  
Na Li ◽  
...  

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