A contactless method for determination of carrier lifetime, surface recombination velocity, and diffusion constant in semiconductors
1988 ◽
Vol 31
(9)
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pp. 1401-1407
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2005 ◽
Vol 20
(11)
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pp. 1136-1142
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1990 ◽
Vol 5
(2)
◽
pp. 101-105
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1972 ◽
Vol 11
(8)
◽
pp. 1161-1164
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