A stochastic model for dielectric breakdown in thin capacitors
1995 ◽
Vol 2
(2)
◽
pp. 101-106
◽
1997 ◽
Vol 281
(4-6)
◽
pp. 325-331
◽
1984 ◽
Vol 36
(5-6)
◽
pp. 909-916
◽
1974 ◽
Vol 32
◽
pp. 544-545
Keyword(s):
Keyword(s):