Electromigration‐induced short‐circuit failure in aluminum underlaid with chemically vapor deposited tungsten

1988 ◽  
Vol 63 (6) ◽  
pp. 1917-1923 ◽  
Author(s):  
Eliot K. Broadbent ◽  
Janet M. Towner ◽  
Paul H. Towsend ◽  
Hubert A. Vander Plas
Keyword(s):  
Short Circuit ◽  
Chemically Vapor Deposited

The dislocation structure of a 10° [110] tilt boundary in silicon

1983 ◽  
Vol 41 ◽  
pp. 114-115
Author(s):  
B. Cunningham ◽  
D.G. Ast
Keyword(s):  
Dislocation Structure ◽  
Tilt Angle ◽  
Imaging Technique ◽  
Diamond Lattice ◽  
Tilt Boundary ◽  
Formation Mechanisms ◽  
Diffraction Contrast ◽  
Lattice Fringe ◽  
Tilt Boundaries ◽  
Chemically Vapor Deposited

There have Been a number of studies of low-angle, θ < 4°, [10] tilt boundaries in the diamond lattice. Dislocations with Burgers vectors a/2<110>, a/2<112>, a<111> and a<001> have been reported in melt-grown bicrystals of germanium, and dislocations with Burgers vectors a<001> and a/2<112> have been reported in hot-pressed bicrystals of silicon. Most of the dislocations were found to be dissociated, the dissociation widths being dependent on the tilt angle. Possible dissociation schemes and formation mechanisms for the a<001> and a<111> dislocations from the interaction of lattice dislocations have recently been given.The present study reports on the dislocation structure of a 10° [10] tilt boundary in chemically vapor deposited silicon. The dislocations in the boundary were spaced about 1-3nm apart, making them difficult to resolve by conventional diffraction contrast techniques. The dislocation structure was therefore studied by the lattice-fringe imaging technique.

Structural Imperfections in thin Oxide Films Formed on Some Fe- and Ni-Base Alloys

1970 ◽  
Vol 28 ◽  
pp. 510-511
Author(s):  
L. P. Lemaire ◽  
D. E. Fornwalt ◽  
F. S. Pettit ◽  
B. H. Kear
Keyword(s):  
Oxide Scale ◽  
Oxidation Process ◽  
Short Circuit ◽  
Protective Oxide ◽  
Protective Oxide Scale ◽  
Thin Oxide Films ◽  
Diffusion Paths ◽  
Oxidation Resistant ◽  
Structural Imperfections ◽  
Short Circuit Diffusion

Oxidation resistant alloys depend on the formation of a continuous layer of protective oxide scale during the oxidation process. The initial stages of oxidation of multi-component alloys can be quite complex, since numerous metal oxides can be formed. For oxidation resistance, the composition is adjusted so that selective oxidation occurs of that element whose oxide affords the most protection. Ideally, the protective oxide scale should be i) structurally perfect, so as to avoid short-circuit diffusion paths, and ii) strongly adherent to the alloy substrate, which minimizes spalling in response to thermal cycling. Small concentrations (∼ 0.1%) of certain reactive elements, such as yttrium, markedly improve the adherence of oxide scales in many alloy systems.

Short Circuit Currents of Normal and Crohn's Diseased Human Colonic Mucosa

Endoscopy ◽  
2006 ◽  
Vol 38 (11) ◽  
Author(s):  
A Patel ◽  
DL Bovell ◽  
AD Corbett ◽  
RJ Holdsworth
Keyword(s):  
Colonic Mucosa ◽  
Short Circuit ◽  
Short Circuit Currents

Determination of parameters of short circuit of power transformer by means of mathematical modeling

2017 ◽  
Vol 26 (102) ◽  
pp. 110-119
Author(s):  
D. S. Yarymbash, ◽  
◽  
S. T. Yarymbash, ◽  
T. E. Divchuk, ◽  
D. A. Litvinov
Keyword(s):  
Mathematical Modeling ◽  
Power Transformer ◽  
Short Circuit ◽  
Determination Of Parameters

Estimation Methods of Short Circuit Current using Normal PMU Measurements and Field Testing

2013 ◽  
Vol 133 (1) ◽  
pp. 37-44
Author(s):  
Suresh Chand Verma ◽  
Yoshiki Nakachi ◽  
Yoshihiko Wazawa ◽  
Yoko Kosaka ◽  
Takenori Kobayashi ◽  
...  
Keyword(s):  
Short Circuit ◽  
Short Circuit Current ◽  
Field Testing ◽  
Estimation Methods

Prospective Transient Recovery Voltage Measurement of Short Circuit Testing Circuit by Reverse Current Injection

2019 ◽  
Vol 139 (8) ◽  
pp. 522-526
Author(s):  
Kyoya Nonaka ◽  
Tadashi Koshizuka ◽  
Eiichi Haginomori ◽  
Hisatoshi Ikeda ◽  
Takeshi Shinkai ◽  
...  
Keyword(s):  
Short Circuit ◽  
Reverse Current ◽  
Current Injection ◽  
Voltage Measurement ◽  
Circuit Testing ◽  
Transient Recovery Voltage ◽  
Recovery Voltage
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