Erratum: ‘‘Theoretical and experimental determination of deep trap profiles in semiconductors’’ [J. Appl. Phys. 61, 1063 (1987)]
1979 ◽
Vol 40
(C7)
◽
pp. C7-709-C7-710
Keyword(s):
2010 ◽
Vol 130
(10)
◽
pp. 1817-1818
Keyword(s):