scholarly journals Parametric x-ray radiation for the grazing incidence geometry

2010 ◽  
Author(s):  
I. D. Feranchuk ◽  
A. I. Benediktovitch ◽  
Remo Ruffini ◽  
Gregory Vereshchagin
Keyword(s):  
Grazing Incidence ◽  
Incidence Geometry ◽  
X Ray ◽  
Grazing Incidence Geometry

Small angle X-Ray Scattering in Grazing Incidence Geometry

2012 ◽  
pp. 2435-2435
Author(s):  
Yimei Zhu ◽  
Hiromi Inada ◽  
Achim Hartschuh ◽  
Li Shi ◽  
Ada Della Pia ◽  
...  
Keyword(s):  
Small Angle ◽  
Grazing Incidence ◽  
Incidence Geometry ◽  
X Ray ◽  
X Ray Scattering ◽  
Grazing Incidence Geometry ◽  
Ray Scattering

Stress in Aluminium Alloys Measured Using Göbel Mirror as a Primary Beam Optics of X-Ray Diffractometer

2011 ◽  
Vol 681 ◽  
pp. 393-398 ◽  
Author(s):  
Marianna Marciszko ◽  
Andrzej Baczmanski ◽  
Nacer Zazi ◽  
Jean Paul Chopart ◽  
Alain Lodini ◽  
...  
Keyword(s):  
Aluminium Alloys ◽  
Grazing Incidence ◽  
Peak Position ◽  
Thin Layers ◽  
Incidence Geometry ◽  
Primary Beam ◽  
Beam Optics ◽  
Surface Layers ◽  
X Ray ◽  
Grazing Incidence Geometry

Grazing incidence geometry, called MGID-sin2y, was applied to measure surface stresses in very thin layers (depth of a few mm) of Al-Mg alloy samples subjected to different thermal and mechanical treatments. The Göbel mirror was used to parallelize the incident X-ray beam. Perfect collimation of the beam significantly increases accuracy of determined peak position and consequently allows to measure low stresses in surface layers.

scholarly journals An X-ray harmonic separator for next-generation synchrotron X-ray sources and X-ray free-electron lasers

2018 ◽  
Vol 25 (2) ◽  
pp. 346-353 ◽  
Author(s):  
Ichiro Inoue ◽  
Taito Osaka ◽  
Kenji Tamasaku ◽  
Haruhiko Ohashi ◽  
Hiroshi Yamazaki ◽  
...  
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
Grazing Incidence ◽  
Incidence Geometry ◽  
Photon Flux ◽  
Free Electron Lasers ◽  
Undulator Radiation ◽  
X Ray ◽  
Grazing Incidence Geometry ◽  
Selection Of

An X-ray prism for the extraction of a specific harmonic of undulator radiation is proposed. By using the prism in a grazing incidence geometry, the beam axes of fundamental and harmonics of undulator radiation are separated with large angles over 10 µrad, which enables the selection of a specific harmonic with the help of apertures, while keeping a high photon flux. The concept of the harmonic separation was experimentally confirmed using X-ray beams from the X-ray free-electron laser SACLA.

scholarly journals Surface morphology smoothing of a 2 inch-diameter GaN homoepitaxial layer observed by X-ray diffraction topography

RSC Advances ◽  
2020 ◽  
Vol 10 (4) ◽  
pp. 1878-1882
Author(s):  
Jaemyung Kim ◽  
Okkyun Seo ◽  
Satoshi Hiroi ◽  
Yoshihiro Irokawa ◽  
Toshihide Nabatame ◽  
...  
Keyword(s):  
Surface Morphology ◽  
Grazing Incidence ◽  
Incidence Geometry ◽  
X Ray Diffraction ◽  
Free Standing ◽  
X Ray ◽  
Grazing Incidence Geometry ◽  
Morphology Changes

We investigated the surface morphology changes in a 2 inch-diameter, c-plane, free-standing GaN wafer using X-ray diffraction topography in a grazing-incidence geometry.

Kerr effect in X-ray grazing incidence geometry

1996 ◽  
Vol 221 (1-4) ◽  
pp. 408-410 ◽  
Author(s):  
V.M. Matveev ◽  
V.V. Matveev
Keyword(s):  
Kerr Effect ◽  
Grazing Incidence ◽  
Incidence Geometry ◽  
X Ray ◽  
Grazing Incidence Geometry

Material analysis end-station of the Hyogo-ken beamline at SPring-8

1998 ◽  
Vol 5 (3) ◽  
pp. 509-511 ◽  
Author(s):  
T. Kaneyoshi ◽  
T. Ishihara ◽  
H. Yoshioka ◽  
M. Motoyama ◽  
S. Fukushima ◽  
...  
Keyword(s):  
Surface Analysis ◽  
Three Dimensional ◽  
Grazing Incidence ◽  
Incidence Geometry ◽  
X Rays ◽  
X Ray Diffraction ◽  
Solid State Detector ◽  
X Ray ◽  
Grazing Incidence Geometry ◽  
State Detector

Plans to construct surface-analysis equipment which will be placed on beamline BL24XU of SPring-8 are presented. There are three experimental hutches in BL24XU, which are available simultaneously by using diamond monochromators as beam splitters. The purpose of the surface-analysis equipment is the simultaneous measurement of fluorescent and diffracted X-rays in grazing-incidence geometry. The instrument is equipped with a solid-state detector (SSD) and a flat position-sensitive proportional counter (PSPC) combined with analysing crystals for X-ray fluorescence (XRF) analysis. A curved PSPC and the goniometer that mounts the SSD used for XRF are also installed for X-ray diffraction. X-ray fluorescence holography and polarized X-ray emission spectroscopy modes are available, so three-dimensional images of atomic configurations and also the anisotropic structure of materials will be studied.

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