scholarly journals Publisher's Note: “The effect of set point ratio and surface Young's modulus on maximum tapping forces in fluid tapping mode atomic force microscopy” [J. Appl. Phys. 107, 044508 (2010)]

2010 ◽  
Vol 107 (6) ◽  
pp. 069905
Author(s):  
Barath Kumar ◽  
Phillip M. Pfifer ◽  
Anthony Giovengo ◽  
Justin Legleiter
Keyword(s):  
Atomic Force Microscopy ◽  
Young’S Modulus ◽  
Young's Modulus ◽  
Set Point ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy

scholarly journals Measurement of Radial Elasticity and Original Height of DNA Duplex Using Tapping-Mode Atomic Force Microscopy

Nanomaterials ◽  
2019 ◽  
Vol 9 (4) ◽  
pp. 561 ◽  
Author(s):  
Longhai Li ◽  
Xu Zhang ◽  
Hongfei Wang ◽  
Qian Lang ◽  
Haitao Chen ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Young’S Modulus ◽  
Young's Modulus ◽  
Interaction Force ◽  
Dna Duplex ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Novel Approach ◽  
Experimental Values

Atomic force microscopy (AFM) can characterize nanomaterial elasticity. However, some one-dimensional nanomaterials, such as DNA, are too small to locate with an AFM tip because of thermal drift and the nonlinearity of piezoelectric actuators. In this study, we propose a novel approach to address the shortcomings of AFM and obtain the radial Young’s modulus of a DNA duplex. The elastic properties are evaluated by combining physical calculations and measured experimental results. The initial elasticity of the DNA is first assumed; based on tapping-mode scanning images and tip–sample interaction force simulations, the calculated elastic modulus is extracted. By minimizing the error between the assumed and experimental values, the extracted elasticity is assigned as the actual modulus for the material. Furthermore, tapping-mode image scanning avoids the necessity of locating the probe exactly on the target sample. In addition to elasticity measurements, the deformation caused by the tapping force from the AFM tip is compensated and the original height of the DNA is calculated. The results show that the radial compressive Young’s modulus of DNA is 125–150 MPa under a tapping force of 0.5–1.3 nN; its original height is 1.9 nm. This approach can be applied to the measurement of other nanomaterials.

Tapping Mode Atomic Force Microscopy Studies of the Photoreduction of Ag+on Individual Submicrometer TiO2Particles

Langmuir ◽  
1999 ◽  
Vol 15 (25) ◽  
pp. 8569-8573 ◽  
Author(s):  
William E. Farneth ◽  
R. Scott McLean ◽  
John D. Bolt ◽  
Eleni Dokou ◽  
Mark A. Barteau
Keyword(s):  
Atomic Force Microscopy ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy

Ultrasonically synthesized organic liquid-filled chitosan microcapsules: part 2: characterization using AFM (atomic force microscopy) and combined AFM–confocal laser scanning fluorescence microscopy

Soft Matter ◽  
2018 ◽  
Vol 14 (16) ◽  
pp. 3192-3201 ◽  
Author(s):  
Srinivas Mettu ◽  
Qianyu Ye ◽  
Meifang Zhou ◽  
Raymond Dagastine ◽  
Muthupandian Ashokkumar
Keyword(s):  
Atomic Force Microscopy ◽  
Fluorescence Microscopy ◽  
Young’S Modulus ◽  
Laser Scanning ◽  
Young's Modulus ◽  
Organic Liquid ◽  
Confocal Laser Scanning ◽  
Confocal Laser ◽  
Force Microscopy ◽  
Atomic Force

Atomic Force Microscopy (AFM) is used to measure the stiffness and Young's modulus of individual microcapsules that have a chitosan cross-linked shell encapsulating tetradecane.

TAPPING MODE ATOMIC FORCE MICROSCOPY OF HYALURONAN AND HYLAN A

Hyaluronan ◽  
2002 ◽  
pp. 109-116 ◽  
Author(s):  
Mary K. Cowman ◽  
Min Li ◽  
Ansil Dyal ◽  
Sonoko Kanai
Keyword(s):  
Atomic Force Microscopy ◽  
Tapping Mode ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mode Atomic Force Microscopy
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