scholarly journals A grazing incidence x-ray streak camera for ultrafast, single-shot measurements

2010 ◽  
Vol 96 (13) ◽  
pp. 134102 ◽  
Author(s):  
J. Feng ◽  
K. Engelhorn ◽  
B. I. Cho ◽  
H. J. Lee ◽  
M. Greaves ◽  
...  
Keyword(s):  
Streak Camera ◽  
Grazing Incidence ◽  
Single Shot ◽  
X Ray

Submicron scale image observation with a grazing incidence reflection-type single-shot soft X-ray microscope

2014 ◽  
Vol 53 (8) ◽  
pp. 080302 ◽  
Author(s):  
Motoyoshi Baba ◽  
Masaharu Nishikino ◽  
Noboru Hasegawa ◽  
Takuro Tomita ◽  
Yasuo Minami ◽  
...  
Keyword(s):  
Grazing Incidence ◽  
Single Shot ◽  
X Ray ◽  
Submicron Scale

Characterization of CsI photocathodes at grazing incidence for use in a unit quantum efficiency x-ray streak camera

2004 ◽  
Author(s):  
Donnacha P. Lowney ◽  
Philip A. Heimann ◽  
Eric M. Gullikson ◽  
Andrew G. MacPhee ◽  
Roger W. Falcone ◽  
...  
Keyword(s):  
Quantum Efficiency ◽  
Streak Camera ◽  
Grazing Incidence ◽  
X Ray

Characterization of CsI photocathodes at grazing incidence for use in a unit quantum efficiency x-ray streak camera

2004 ◽  
Vol 75 (10) ◽  
pp. 3131-3137 ◽  
Author(s):  
D. P. Lowney ◽  
P. A. Heimann ◽  
H. A. Padmore ◽  
E. M. Gullikson ◽  
A. G. MacPhee ◽  
...  
Keyword(s):  
Quantum Efficiency ◽  
Streak Camera ◽  
Grazing Incidence ◽  
X Ray

scholarly journals Results from single shot grazing incidence hard x-ray damage measurements conducted at the SACLA FEL

2013 ◽  
Author(s):  
Andrew Aquila ◽  
Cigdem Ozkan ◽  
Ryszard Sobierajski ◽  
Vera Hájková ◽  
Tomás Burian ◽  
...  
Keyword(s):  
Grazing Incidence ◽  
Single Shot ◽  
X Ray

Fast acquisition of extensive X-ray diffraction patterns of a gas–liquid interface in grazing-incidence geometry

2012 ◽  
Vol 46 (1) ◽  
pp. 270-275 ◽  
Author(s):  
Oleg V. Konovalov ◽  
Alexei A. Vorobiev
Keyword(s):  
Structural Changes ◽  
Grazing Incidence ◽  
Liquid Interface ◽  
Incidence Geometry ◽  
Fourth Generation ◽  
Single Shot ◽  
Two Dimensional ◽  
Large Area ◽  
X Ray ◽  
Monomolecular Layers

The development of third-generation synchrotron sources has inspired qualitative and quantitative breakthroughs in structural studies of monomolecular organic layers. To study such systems formed at the gas–liquid interface, grazing-incidence diffraction (GID) has proved to be the most powerful technique. Until quite recently, in most cases, GID was performedviaa scanning approach with use of a collimating system in front of the detector to eliminate the effect of parallax and to achieve the required angular resolution. Owing to the long counting time required, this kind of measurement often introduces significant radiation damage to a sample and considerably restricts time-resolved studies, preventing the pursuit of emerging scientific areas such as the investigation of fast kinetic structural changes in two-dimensional systems. This problem can apparently become a real obstacle for the application of the scanning GID technique at fourth-generation synchrotron sources because of the extremely high X-ray fluxes involved. This article discusses the possibility of significantly reducing the measuring time and avoiding the beam parallax problem by using a high-brilliance submillimetre beam and a large-area two-dimensional detector (e.g.PILATUS) in a single-shot GID measurement on large-area sample surfaces. Both theoretical considerations of the problem and experimental GID results from monomolecular layers of behenic acid at the gas–water interface are presented, with a detailed description of the experimental conditions. The possibility of a diffraction imaging study of the texture of Langmuir monomolecular layers is demonstrated.

Single-shot terahertz-field-driven X-ray streak camera

2009 ◽  
Vol 3 (9) ◽  
pp. 523-528 ◽  
Author(s):  
Ulrike Frühling ◽  
Marek Wieland ◽  
Michael Gensch ◽  
Thomas Gebert ◽  
Bernd Schütte ◽  
...  
Keyword(s):  
Streak Camera ◽  
Single Shot ◽  
X Ray

New Structure of CTAB Templated Silica Films as revealed by GISAXS coupled to HRTEM

2000 ◽  
Vol 628 ◽  
Author(s):  
Sophie Besson ◽  
Catherine Jacquiod ◽  
Thierry Gacoin ◽  
André Naudon ◽  
Christian Ricolleau ◽  
...  
Keyword(s):  
Cetyltrimethylammonium Bromide ◽  
Grazing Incidence ◽  
Hexagonal Structure ◽  
X Ray Diffraction ◽  
Electronic Microscopy ◽  
Silica Films ◽  
X Ray ◽  
X Ray Scattering ◽  
Hexagonal Arrangement ◽  
Spherical Micelles

ABSTRACTA microstructural study on surfactant templated silica films is performed by coupling traditional X-Ray Diffraction (XRD) and Transmission Electronic Microscopy (TEM) to Grazing Incidence Small Angle X-Ray Scattering (GISAXS). By this method it is shown that spin-coating of silicate solutions with cationic surfactant cetyltrimethylammonium bromide (CTAB) as a templating agent provides 3D hexagonal structure (space group P63/mmc) that is no longer compatible with the often described hexagonal arrangement of tubular micelles but rather with an hexagonal arrangement of spherical micelles. The extent of the hexagonal ordering and the texture can be optimized in films by varying the composition of the solution.

X-Ray Fluorescence Spectrometer with Geometry of Grazing Incidence X-ray Radiation

2012 ◽  
Vol 1 (2) ◽  
pp. 78-82
Author(s):  
N.M. Novikovskii ◽  
◽  
V.M. Raznomazov ◽  
V.O. Ponomarenko ◽  
D.A. Sarychev ◽  
...  
Keyword(s):  
Grazing Incidence ◽  
X Ray ◽  
Fluorescence Spectrometer

Quantifying Multiple Crystallite Orientations and Crystal Heterogeneities in Complex Thin Film Materials

2019 ◽  
Author(s):  
Jonathan Ogle ◽  
Daniel Powell ◽  
Eric Amerling ◽  
Detlef Matthias Smilgies ◽  
Luisa Whittaker-Brooks
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Structural Design ◽  
Grazing Incidence ◽  
Crystallite Orientation ◽  
Miller Index ◽  
X Ray ◽  
X Ray Scattering ◽  
Orientation Distributions ◽  
Orientation Information

<p>Thin film materials have become increasingly complex in morphological and structural design. When characterizing the structure of these films, a crucial field of study is the role that crystallite orientation plays in giving rise to unique electronic properties. It is therefore important to have a comparative tool for understanding differences in crystallite orientation within a thin film, and also the ability to compare the structural orientation between different thin films. Herein, we designed a new method dubbed the mosaicity factor (MF) to quantify crystallite orientation in thin films using grazing incidence wide-angle X-ray scattering (GIWAXS) patterns. This method for quantifying the orientation of thin films overcomes many limitations inherent in previous approaches such as noise sensitivity, the ability to compare orientation distributions along different axes, and the ability to quantify multiple crystallite orientations observed within the same Miller index. Following the presentation of MF, we proceed to discussing case studies to show the efficacy and range of application available for the use of MF. These studies show how using the MF approach yields quantitative orientation information for various materials assembled on a substrate.<b></b></p>

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