Measurement of the silver freezing point with an optical fiber thermometer: Proof of concept

1986 ◽  
Vol 59 (4) ◽  
pp. 1005-1012 ◽  
Author(s):  
R. R. Dils ◽  
J. Geist ◽  
M. L. Reilly
2016 ◽  
Author(s):  
Luca Schenato ◽  
Alessandro Pasuto ◽  
Andrea Galtarossa ◽  
Luca Palmieri

Author(s):  
Ramona Gălătuș ◽  
Paul Faragó ◽  
Piotr Miluski ◽  
Juan-Antonio Valles

2020 ◽  
Vol 67 (1) ◽  
pp. 140-145
Author(s):  
Diego Di Francesca ◽  
Keziban Kandemir ◽  
Gaetano Li Vecchi ◽  
Ruben Garcia Alia ◽  
Yacine Kadi ◽  
...  

2006 ◽  
Vol 21 (7) ◽  
pp. 1359-1364 ◽  
Author(s):  
J. Chance Carter ◽  
Rosa M. Alvis ◽  
Steve B. Brown ◽  
Kevin C. Langry ◽  
Thomas S. Wilson ◽  
...  

Author(s):  
Arnaldo Leal ◽  
Leticia Avellar ◽  
Maria José Pontes ◽  
Carmilo A. Díaz ◽  
Carlos Marques ◽  
...  

2018 ◽  
Vol 36 (17) ◽  
pp. 3733-3738 ◽  
Author(s):  
Alberto Rodriguez Cuevas ◽  
Marco Fontana ◽  
Luis Rodriguez-Cobo ◽  
Mauro Lomer ◽  
Jose Miguel Lopez-Higuera

Author(s):  
A. G. Jackson ◽  
M. Rowe

Diffraction intensities from intermetallic compounds are, in the kinematic approximation, proportional to the scattering amplitude from the element doing the scattering. More detailed calculations have shown that site symmetry and occupation by various atom species also affects the intensity in a diffracted beam. [1] Hence, by measuring the intensities of beams, or their ratios, the occupancy can be estimated. Measurement of the intensity values also allows structure calculations to be made to determine the spatial distribution of the potentials doing the scattering. Thermal effects are also present as a background contribution. Inelastic effects such as loss or absorption/excitation complicate the intensity behavior, and dynamical theory is required to estimate the intensity value.The dynamic range of currents in diffracted beams can be 104or 105:1. Hence, detection of such information requires a means for collecting the intensity over a signal-to-noise range beyond that obtainable with a single film plate, which has a S/N of about 103:1. Although such a collection system is not available currently, a simple system consisting of instrumentation on an existing STEM can be used as a proof of concept which has a S/N of about 255:1, limited by the 8 bit pixel attributes used in the electronics. Use of 24 bit pixel attributes would easily allowthe desired noise range to be attained in the processing instrumentation. The S/N of the scintillator used by the photoelectron sensor is about 106 to 1, well beyond the S/N goal. The trade-off that must be made is the time for acquiring the signal, since the pattern can be obtained in seconds using film plates, compared to 10 to 20 minutes for a pattern to be acquired using the digital scan. Parallel acquisition would, of course, speed up this process immensely.


Author(s):  
E.T. O’Toole ◽  
G.P. Wray ◽  
J.R. Kremer ◽  
J.R. Mcintosh

Ultrarapid freezing and cryomicroscopy of frozen hydrated material makes it possible to visualize samples that have never been exposed to chemical fixatives, dehydration, or stains. In principle, freezing and cryoimaging methods avoid artifacts associated with chemical fixation and processing and allow one to visualize the specimen in a condition that is close to its native state. Here we describe a way to use a high voltage electron microscope (HVEM) for the cryoimaging of frozen hydrated PTK1 cells.PTK1 cells were cultured on formvar-coated, carbon stabilized gold grids. After three days in culture, the grids were removed from the culture medium and blotted in a humidity chamber at 35° C. In some instances, the grids were rinsed briefly in 0.16 M ammonium acetate buffer (pH 7.2) prior to blotting. After blotting, the grids were transferred to a plunging apparatus and plunged into liquid ethane held directly above its freezing point. The plunging apparatus consists of a vertical slide rail that guides the fall of a mounted pair of forceps that clamp the specimen. The forceps are surrounded by a plexiglass humidity chamber mounted over a dewar of liquid nitrogen containing an ethane chamber. After freezing, the samples were transferred to liquid nitrogen and viewed in a JEOL JEM 1000 equipped with a top entry cold stage designed and built by Mr. George Wray (Univ. Colorado). The samples were routinely exposed to electron doses of 1 e/Å2/sec, and viewed at a temperature of −150° C. A GATAN video system was used to enhance contrast and to estimate the correct amount of underfocus needed to obtain phase contrast at various magnifications. Low dose micrographs were taken using two second exposures of Kodak 4463 film. The state of the solid water in the specimen was determined by diffraction using a 30/μm field limiting aperture and a camera length of 1 meter.


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