Direct evidence for an order/disorder phase transition atx≂0.3 in single‐crystal metastable (GaSb)(1−x)(Ge2)xalloys: High‐resolution x‐ray diffraction measurements

1986 ◽  
Vol 59 (5) ◽  
pp. 1482-1487 ◽  
Author(s):  
S. I. Shah ◽  
B. Kramer ◽  
S. A. Barnett ◽  
J. E. Greene
Keyword(s):  
Phase Transition ◽  
High Resolution ◽  
Single Crystal ◽  
Direct Evidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Disorder Phase Transition

Synchrotron white beam x-ray topography (SWBXT) and high resolution triple axis diffraction studies on AlN layers grown on 4H- and 6H-SiC seeds

2004 ◽  
Vol 831 ◽  
Author(s):  
Balaji Raghothamachar ◽  
Michael Dudley ◽  
Rafael Dalmau ◽  
Raoul Schlesser ◽  
Zlatko Sitar
Keyword(s):  
High Resolution ◽  
Single Crystal ◽  
Large Diameter ◽  
Laser Diodes ◽  
Growth Conditions ◽  
X Ray Diffraction ◽  
X Ray ◽  
White Beam ◽  
Strain Data ◽  
Growth Experiments

ABSTRACTFor nitride based devices such as LEDs, high power FETs and laser diodes, single crystal substrates of AlN are highly desirable. While the sublimation technique is suitable for growing bulk AlN crystals, appropriate seeds are also necessary for growing large diameter oriented boules. 4H- and 6H-SiC substrates which are readily available commercially can potentially be implemented as seeds for bulk AlN growth. However, issues regarding SiC decomposition at high temperatures, thermal expansion mismatch, single crystal growth, etc. need to be addressed. Towards this end, a series of growth experiments have been carried out in a resistively heated reactor using on and off-axis 4H- and 6H-SiC substrates as seeds for AlN growth from the vapor phase. Several hundred microns thick AlN layers have been grown under different growth conditions. Synchrotron white beam x-ray topography (SWBXT) has been used to map the defect distribution in the grown layers and high resolution triple axis x-ray diffraction (HRTXD) experiments were carried out to record reciprocal space maps from which tilt, mismatch and strain data can be obtained. These results are analyzed with respect to the growth conditions in order to gain a better understanding of this growth process.

X-ray Diffraction Study of Order–Disorder Phase Transition in CuMPt6 (M=3d Elements) Alloys

2009 ◽  
Vol 78 (1) ◽  
pp. 014601 ◽  
Author(s):  
Ejaz Ahmed ◽  
Miwako Takahashi ◽  
Hiroshi Iwasaki ◽  
Ken-ichi Ohshima
Keyword(s):  
Phase Transition ◽  
Diffraction Study ◽  
X Ray Diffraction ◽  
X Ray ◽  
Disorder Phase Transition ◽  
3D Elements

scholarly journals Mechanism of the Lamellar/Inverse Hexagonal Phase Transition Examined by High Resolution X-Ray Diffraction

2003 ◽  
Vol 84 (5) ◽  
pp. 3111-3122 ◽  
Author(s):  
Michael Rappolt ◽  
Andrea Hickel ◽  
Frank Bringezu ◽  
Karl Lohner
Keyword(s):  
Phase Transition ◽  
High Resolution ◽  
Hexagonal Phase ◽  
X Ray Diffraction ◽  
X Ray

Scatterless hybrid metal–single-crystal slit for small-angle X-ray scattering and high-resolution X-ray diffraction

2008 ◽  
Vol 41 (6) ◽  
pp. 1134-1139 ◽  
Author(s):  
Youli Li ◽  
Roy Beck ◽  
Tuo Huang ◽  
Myung Chul Choi ◽  
Morito Divinagracia
Keyword(s):  
High Resolution ◽  
Single Crystal ◽  
Small Angle ◽  
Incident Beam ◽  
Single Crystal Substrate ◽  
X Ray Diffraction ◽  
Metal Base ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

A simple hybrid design has been developed to produce practically scatterless aperture slits for small-angle X-ray scattering and high-resolution X-ray diffraction. The hybrid slit consists of a rectangular single-crystal substrate (e.g.Si or Ge) bonded to a high-density metal base with a large taper angle (> 10°). The beam-defining single-crystal tip is oriented far from any Bragg peak position with respect to the incident beam and hence produces none of the slit scattering commonly associated with conventional metal slits. It has been demonstrated that the incorporation of the scatterless slits leads to a much simplified design in small-angle X-ray scattering instruments employing only one or two apertures, with dramatically increased intensity (a threefold increase observed in the test setup) and improved low-angle resolution.

A new high-pressure phase transition in clinoferrosilite: In situ single-crystal X-ray diffraction study

2017 ◽  
Vol 102 (3) ◽  
pp. 666-673 ◽  
Author(s):  
Anna Pakhomova ◽  
Leyla Ismailova ◽  
Elena Bykova ◽  
Maxim Bykov ◽  
Tiziana Boffa Ballaran ◽  
...  
Keyword(s):  
Phase Transition ◽  
High Pressure ◽  
Single Crystal ◽  
Diffraction Study ◽  
High Pressure Phase ◽  
X Ray Diffraction ◽  
X Ray ◽  
High Pressure Phase Transition ◽  
Pressure Phase
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