Effect of doping concentration on the performance of large‐grain polycrystalline silicon solar cell

1986 ◽  
Vol 59 (6) ◽  
pp. 2259-2261 ◽  
Author(s):  
C. A. Dimitriadis
Keyword(s):  
Solar Cell ◽  
Polycrystalline Silicon ◽  
Silicon Solar Cell ◽  
Doping Concentration ◽  
Effect Of Doping

Influence of ultrathin gahnite anti-reflection coating on the power conversion efficiency of polycrystalline silicon solar cell

2019 ◽  
Vol 31 (3) ◽  
pp. 2308-2319 ◽  
Author(s):  
Gobinath Velu Kaliyannan ◽  
Senthil Velmurugan Palanisamy ◽  
Rajasekar Rathanasamy ◽  
Manivasakan Palanisamy ◽  
Sathish Kumar Palaniappan ◽  
...  
Keyword(s):  
Solar Cell ◽  
Power Conversion Efficiency ◽  
Conversion Efficiency ◽  
Polycrystalline Silicon ◽  
Silicon Solar Cell ◽  
Power Conversion

Photoelectric efficiency enhancement of a polycrystalline silicon solar cell coated with an EVA film containing Eu3+ complex by addition of modified SiO2

RSC Advances ◽  
2016 ◽  
Vol 6 (111) ◽  
pp. 110409-110415 ◽  
Author(s):  
Jin Dong ◽  
Baoping Lin
Keyword(s):  
Solar Cell ◽  
Composite Film ◽  
Conversion Efficiency ◽  
Polycrystalline Silicon ◽  
Silicon Solar Cell ◽  
Photoelectric Conversion Efficiency ◽  
Efficiency Enhancement ◽  
Photoelectric Conversion

Modified SiO2 was doped into an EVA film containing a Eu3+ complex and the results show that the fluorescence of the EVA composite film increased, which helped to improve the photoelectric conversion efficiency of the solar cell.

Imaging of a Polycrystalline Silicon Solar Cell Using a Laser Terahertz Emission Microscope

2012 ◽  
Vol 5 (11) ◽  
pp. 112301 ◽  
Author(s):  
Hidetoshi Nakanishi ◽  
Shogo Fujiwara ◽  
Kazuhisa Takayama ◽  
Iwao Kawayama ◽  
Hironaru Murakami ◽  
...  
Keyword(s):  
Solar Cell ◽  
Polycrystalline Silicon ◽  
Silicon Solar Cell ◽  
Terahertz Emission

Polycrystalline Silicon Wafer Surface Color Defect Inspection Based on Machine Vision

2014 ◽  
Vol 548-549 ◽  
pp. 48-52 ◽  
Author(s):  
Han Wang ◽  
Rui Miao ◽  
Xiao Song Wu ◽  
Wang Yuan Ni ◽  
Xu Chen Tang
Keyword(s):  
Solar Cell ◽  
Machine Vision ◽  
Silicon Wafer ◽  
Polycrystalline Silicon ◽  
Silicon Solar Cell ◽  
Wafer Surface ◽  
Actual Application ◽  
Silicon Wafer Surface ◽  
Surface Defect Detection ◽  
Low Efficiency

As non-uniform color and complex texture exist on the polycrystalline silicon solar cell, manual surface inspection adopted by most domestic factories suffers from low efficiency and poor repetitive detection ability. To overcome the shortcomings of manual inspection, based on machine vision and SVM, an automatic silicon wafer surface defect detection and classification system has been developed in this paper: through feature extraction of color images and defect areas, a series of wafer classifiers are trained and used to separate the defective products from qualified ones. Experiments on samples and actual application in the enterprise show that the system has achieved high accuracy and fast run-time performance, indicating that machine vision is an effective and promising method for polycrystalline silicon solar cell inspection.

16.7% efficient, laser textured, buried contact polycrystalline silicon solar cell

1989 ◽  
Vol 55 (22) ◽  
pp. 2363-2365 ◽  
Author(s):  
John C. Zolper ◽  
Srinivasamohan Narayanan ◽  
Stuart R. Wenham ◽  
Martin A. Green
Keyword(s):  
Solar Cell ◽  
Polycrystalline Silicon ◽  
Silicon Solar Cell
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