Structural characterization of metastable hcp–Ni thin films epitaxially grown on Au(100) single-crystal underlayers

2010 ◽  
Vol 107 (9) ◽  
pp. 09E310 ◽  
Keyword(s):  
Thin Films ◽  
Single Crystal ◽  
Structural Characterization

Structural Characterization of FePd, FePt, and CoPt Alloy Thin Films Epitaxially Grown on (001) Surface of Different Single-Crystal Materials

2014 ◽  
Vol 50 (1) ◽  
pp. 1-4 ◽  
Author(s):  
Yusuke Numata ◽  
Akira Itabashi ◽  
Mitsuru Ohtake ◽  
Fumiyoshi Kirino ◽  
Masaaki Futamoto
Keyword(s):  
Thin Films ◽  
Single Crystal ◽  
Structural Characterization

Structural characterization of V2O5–TiO2 thin films deposited by RF sputtering from a titanium target with vanadium insets

2005 ◽  
Vol 109 (1) ◽  
pp. 47-51 ◽  
Author(s):  
I. Alessandri ◽  
E. Comini ◽  
E. Bontempi ◽  
G. Sberveglieri ◽  
L.E. Depero
Keyword(s):  
Thin Films ◽  
Structural Characterization ◽  
Rf Sputtering ◽  
Tio2 Thin Films ◽  
Titanium Target

Structural characterization of electrodeposited EuSe thin films

2001 ◽  
Vol 36 (15) ◽  
pp. 2613-2626 ◽  
Author(s):  
N.S Gaikwad ◽  
C.H Bhosale
Keyword(s):  
Thin Films ◽  
Structural Characterization

Structural characterization of cevimeline and its trans -impurity by single crystal XRD

2016 ◽  
Vol 118 ◽  
pp. 404-409 ◽  
Author(s):  
Dmitrijs Stepanovs ◽  
Zenta Tetere ◽  
Irisa Rāviņa ◽  
Viktors Kumpiņš ◽  
Daina Zicāne ◽  
...  
Keyword(s):  
Single Crystal ◽  
Structural Characterization ◽  
Single Crystal Xrd

Synthesis and structural characterization of a magnesium phthalocyanine(3–) anion

2012 ◽  
Vol 16 (01) ◽  
pp. 154-162 ◽  
Author(s):  
Edwin W.Y. Wong ◽  
Daniel B. Leznoff
Keyword(s):  
Absorption Spectrum ◽  
Solid State ◽  
Single Crystal ◽  
Structural Characterization ◽  
Heterometallic Complex ◽  
State Structure ◽  
Solid State Structure ◽  
X Ray ◽  
X Ray Crystallography

The reduction of magnesium phthalocyanine (MgPc) with 2.2 equivalents of potassium graphite in 1,2-dimethoxyethane (DME) gives [K2(DME)4]PcMg(OH)(1) in 67% yield. Compound 1 was structurally characterized using single crystal X-ray crystallography and was found to be a monomeric, heterometallic complex consisting of a μ3-OH ligand that bridges a [MgIIPc3-]- anion to two potassium cations solvated by four DME molecules. An absorption spectrum of 1 confirms the Pc ligand is singly reduced and has a 3–charge. The solid-state structure of 1 does not indicate breaking of the aromaticity of the Pc ligand. Compound 1 is only the second Pc3- complex and the first reduced MgPc to be isolated and structurally characterized.

Reactive UHV Sputtering and Structural Characterization of Epitaxial AlN/6H-SiC(0001) Thin Films

1998 ◽  
Vol 264-268 ◽  
pp. 1225-1228 ◽  
Author(s):  
Sukkaneste Tungasmita ◽  
Jens Birch ◽  
L. Hultman ◽  
Erik Janzén ◽  
J.-E. Sundgren
Keyword(s):  
Thin Films ◽  
Structural Characterization

Optical absorption and structural characterization of reactively sputtered tellurium suboxide thin films

1993 ◽  
Vol 65-66 ◽  
pp. 313-318 ◽  
Author(s):  
M. Di Giulio ◽  
M.C. Nicotra ◽  
M. Re ◽  
R. Rella ◽  
P. Siciliano
Keyword(s):  
Thin Films ◽  
Optical Absorption ◽  
Structural Characterization

Preparation and Structural Characterization of hcp and fcc Ni Epitaxial Thin Films on Ru Underlayers with Different Orientations

2011 ◽  
Vol 50 (6) ◽  
pp. 063001 ◽  
Author(s):  
Jumpei Higuchi ◽  
Mitsuru Ohtake ◽  
Yoichi Sato ◽  
Tsutomu Nishiyama ◽  
Masaaki Futamoto
Keyword(s):  
Thin Films ◽  
Structural Characterization ◽  
Epitaxial Thin Films
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