Domain‐wall surface energy derived from the complex impedance of Metglas ribbons traversed by ac currents

1985 ◽  
Vol 57 (8) ◽  
pp. 3505-3507 ◽  
Author(s):  
A. K. Agarwala ◽  
L. Berger
Keyword(s):  
Domain Wall ◽  
Surface Energy ◽  
Complex Impedance ◽  
Wall Surface

Surface Energy of a 90° Domain Wall in Iron

1958 ◽  
Vol 29 (10) ◽  
pp. 1451-1453 ◽  
Author(s):  
C. D. Graham
Keyword(s):  
Domain Wall ◽  
Surface Energy

Errata: Surface Energy of a 90° Domain Wall in Iron

1959 ◽  
Vol 30 (12) ◽  
pp. 2022-2022 ◽  
Author(s):  
C. D. Graham
Keyword(s):  
Domain Wall ◽  
Surface Energy

scholarly journals Melting of spatially modulated phases at domain wall/surface junctions in antiferrodistortive multiferroics

2020 ◽  
Vol 102 (7) ◽  
Author(s):  
Anna N. Morozovska ◽  
Eugene A. Eliseev ◽  
Deyang Chen ◽  
Vladislav Shvetz ◽  
Christopher T. Nelson ◽  
...  
Keyword(s):  
Domain Wall ◽  
Wall Surface ◽  
Modulated Phases

Controlling food powder deposition in spray dryers: Wall surface energy manipulation as an alternative

2009 ◽  
Vol 94 (2) ◽  
pp. 192-198 ◽  
Author(s):  
M.W. Woo ◽  
W.R.W. Daud ◽  
S.M. Tasirin ◽  
M.Z.M. Talib
Keyword(s):  
Surface Energy ◽  
Wall Surface ◽  
Powder Deposition ◽  
Food Powder

scholarly journals Direct Observation of Domain-Wall Surface Tension by Deflating or Inflating a Magnetic Bubble

2018 ◽  
Vol 9 (2) ◽  
Author(s):  
Xueying Zhang ◽  
Nicolas Vernier ◽  
Weisheng Zhao ◽  
Haiming Yu ◽  
Laurent Vila ◽  
...  
Keyword(s):  
Surface Tension ◽  
Domain Wall ◽  
Direct Observation ◽  
Wall Surface ◽  
Magnetic Bubble

Electron Microscopy of Graphite Intercalation Compounds

1982 ◽  
Vol 40 ◽  
pp. 544-545
Author(s):  
G. Timp ◽  
L. Salamanca-Riba ◽  
L.W. Hobbs ◽  
G. Dresselhaus ◽  
M.S. Dresselhaus
Keyword(s):  
Electron Microscopy ◽  
Phase Transitions ◽  
Domain Wall ◽  
Intercalation Compounds ◽  
Lattice Plane ◽  
Wall Model ◽  
Graphite Intercalation Compounds ◽  
Fundamental Symmetry ◽  
Graphite Intercalation

Electron microscopy can be used to study structures and phase transitions occurring in graphite intercalations compounds. The fundamental symmetry in graphite intercalation compounds is the staging periodicity whereby each intercalate layer is separated by n graphite layers, n denoting the stage index. The currently accepted model for intercalation proposed by Herold and Daumas assumes that the sample contains equal amounts of intercalant between any two graphite layers and staged regions are confined to domains. Specifically, in a stage 2 compound, the Herold-Daumas domain wall model predicts a pleated lattice plane structure.

The direct determination of magnetic domain wall profiles using a split detector STEM

1978 ◽  
Vol 36 (1) ◽  
pp. 466-467
Author(s):  
J.N. Chapman ◽  
P.E. Batson ◽  
E.M. Waddell ◽  
R.P. Ferrier
Keyword(s):  
Electron Microscope ◽  
Domain Wall ◽  
Transmission Electron Microscope ◽  
Domain Walls ◽  
Photographic Plate ◽  
Magnetic Domain ◽  
Direct Determination ◽  
Quantitative Information ◽  
Scanning Transmission Electron Microscope ◽  
Transmission Electron

By far the most commonly used mode of Lorentz microscopy in the examination of ferromagnetic thin films is the Fresnel or defocus mode. Use of this mode in the conventional transmission electron microscope (CTEM) is straightforward and immediately reveals the existence of all domain walls present. However, if such quantitative information as the domain wall profile is required, the technique suffers from several disadvantages. These include the inability to directly observe fine image detail on the viewing screen because of the stringent illumination coherence requirements, the difficulty of accurately translating part of a photographic plate into quantitative electron intensity data, and, perhaps most severe, the difficulty of interpreting this data. One solution to the first-named problem is to use a CTEM equipped with a field emission gun (FEG) (Inoue, Harada and Yamamoto 1977) whilst a second is to use the equivalent mode of image formation in a scanning transmission electron microscope (STEM) (Chapman, Batson, Waddell, Ferrier and Craven 1977), a technique which largely overcomes the second-named problem as well.

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