Measurement of optical constants of Si and SiO2 from reflection electron energy loss spectra using factor analysis method
2010 ◽
Vol 42
(6-7)
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pp. 1076-1081
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Keyword(s):
1974 ◽
Vol 64
(2)
◽
pp. 515-525
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Keyword(s):
1974 ◽
Vol 15
(3)
◽
pp. 555-558
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Keyword(s):
1990 ◽
Vol 48
(2)
◽
pp. 82-83