Linear dose dependence of ion beam mixing of metals on Si

1985 ◽  
Vol 57 (4) ◽  
pp. 1414-1416 ◽  
Author(s):  
D. B. Poker ◽  
B. R. Appleton
1991 ◽  
Vol 6 (6) ◽  
pp. 1175-1187 ◽  
Author(s):  
François Rossi ◽  
M. Nastasi ◽  
M. Cohen ◽  
C. Olsen ◽  
J.R. Tesmer ◽  
...  

Bilayer samples of U/Al, U/Ti, U/Si, and U/C have been ion beam mixed with 400 keV Ar and U/Al with Xe ions at doses from 2 × 1015 to 1 × 1017 ions/cm2. Mixing experiments were performed at various temperatures between 77 and 420 K. The amount of interfacial mixing, 4Dt, follows a linear dose dependence below a critical temperature, depending on the system studied. Below this temperature, the mixing efficiency, defined as ∂(4Dt)Φ where 4Dt is the mixing and Φ is the dose, is temperature independent. Its value, as well as the value of the transition temperature, agrees well with the thermodynamical model of chemically biased diffusion in a thermal spike for the four systems tested. The transition between the thermal spike regime and the temperature enhanced mixing regime was interpreted on the basis of an intracascade mechanism. The formation of an intermetallic compound in the U/Al system was detected and interpreted on a qualitative basis by crystallographic considerations.


1989 ◽  
Vol 157 ◽  
Author(s):  
J. B. Malherbe ◽  
K. P. Weimer ◽  
L. J. Bredell ◽  
E. Friedland ◽  
G. Myburg

ABSTRACTThe I—V characteristics of as—deposited antimony Schottky contacts on silicon were extremely sensitive to interface conditions. This led to unpredictable results for the unimplanted contacts. After Si* implantation the contacts displayed more uniform I—V characteristics. Implantation led to higher values for the ideality constant, the series resistance and for the saturation current. The ideality factor seems to decrease at the higher implantation doses (ϕ ≥ 5×1014 Sb+cn−2), while no clear dose dependence patterns were observed for the saturation current and series resistance after implantation.


Author(s):  
A. K. Rai ◽  
R. S. Bhattacharya ◽  
M. H. Rashid

Ion beam mixing has recently been found to be an effective method of producing amorphous alloys in the binary metal systems where the two original constituent metals are of different crystal structure. The mechanism of ion beam mixing are not well understood yet. Several mechanisms have been proposed to account for the observed mixing phenomena. The first mechanism is enhanced diffusion due to defects created by the incoming ions. Second is the cascade mixing mechanism for which the kinematicel collisional models exist in the literature. Third mechanism is thermal spikes. In the present work we have studied the mixing efficiency and ion beam induced amorphisation of Ni-Ti system under high energy ion bombardment and the results are compared with collisional models. We have employed plan and x-sectional veiw TEM and RBS techniques in the present work.


1988 ◽  
Vol 106 (4) ◽  
pp. 297-309 ◽  
Author(s):  
D. M. Phase ◽  
Jayashree Patankar ◽  
V. N. Kulkarni ◽  
S. B. Ogale

2020 ◽  
Vol 1713 ◽  
pp. 012012
Author(s):  
P V Bykov ◽  
V L Vorob’ev ◽  
I N Klimova ◽  
A A Kolotov ◽  
A Yu Drozdov ◽  
...  

2010 ◽  
Vol 64 (1) ◽  
pp. 96-98 ◽  
Author(s):  
T.L. Wang ◽  
W.T. Huang ◽  
W.C. Wang ◽  
B.X. Liu

2003 ◽  
Vol 426-432 ◽  
pp. 2569-2574
Author(s):  
Hiroshi Nagasaka ◽  
T. Yamakawa ◽  
T. Kataoka ◽  
M. Kakutani ◽  
T. Takeuchi ◽  
...  

1989 ◽  
Vol 213 (2-3) ◽  
pp. A230
Author(s):  
M. StróŻak ◽  
P. MikoŁajczak ◽  
M. Subotowicz
Keyword(s):  
Ion Beam ◽  

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