Texture and magnetic properties of exchange bias systems

2010 ◽  
Vol 107 (9) ◽  
pp. 09D722 ◽  
Author(s):  
N. P. Aley ◽  
M. Bowes ◽  
R. Kröger ◽  
K. O’Grady
2020 ◽  
Vol 8 (34) ◽  
pp. 11704-11714
Author(s):  
You Jin Kim ◽  
Shinya Konishi ◽  
Yuichiro Hayasaka ◽  
Ryo Ota ◽  
Ryosuke Tomozawa ◽  
...  

Epitaxial TmFe2O4 thin film with self-assembled interface structure was grown on yttria-stabilized zirconia substrate. TmFe2O4 phase itself shows glassy behavior and the interface leads to the exchange bias effect.


2014 ◽  
Vol 104 (2) ◽  
pp. 022407 ◽  
Author(s):  
J. Y. Yu ◽  
K. Huang ◽  
H. Y. Wu ◽  
Y. Feng ◽  
L. Wang ◽  
...  

2011 ◽  
Vol 109 (7) ◽  
pp. 07B520 ◽  
Author(s):  
R. Zeng ◽  
J. Q. Wang ◽  
Z. X. Chen ◽  
W. X. Li ◽  
S. X. Dou

2010 ◽  
Vol 150 (15-16) ◽  
pp. 804-808 ◽  
Author(s):  
Ravi P. Singh ◽  
C.V. Tomy

2014 ◽  
Vol 116 (13) ◽  
pp. 134302 ◽  
Author(s):  
V. Hrkac ◽  
E. Lage ◽  
G. Köppel ◽  
J. Strobel ◽  
J. McCord ◽  
...  

2021 ◽  
Vol 7 (10) ◽  
pp. 136
Author(s):  
Adriano Verna ◽  
Raffaella Capelli ◽  
Luca Pasquali

In this review, the technique of resonant soft X-ray reflectivity in the study of magnetic low-dimensional systems is discussed. This technique is particularly appealing in the study of magnetization at buried interfaces and to discriminate single elemental contributions to magnetism, even when this is ascribed to few atoms. The major fields of application are described, including magnetic proximity effects, thin films of transition metals and related oxides, and exchange-bias systems. The fundamental theoretical background leading to dichroism effects in reflectivity is also briefly outlined.


2019 ◽  
Vol 492 ◽  
pp. 165686 ◽  
Author(s):  
Xingqi Han ◽  
Changcai Chen ◽  
Shengcan Ma ◽  
Zhishuo Zhang ◽  
Kai Liu ◽  
...  

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