Two‐dimensional mode analysis of the Raman‐type free‐electron laser

1984 ◽  
Vol 55 (3) ◽  
pp. 637-646 ◽  
Author(s):  
T. Shiozawa ◽  
T. Nakashima
Keyword(s):  
Free Electron ◽  
Free Electron Laser ◽  
Mode Analysis ◽  
Two Dimensional

scholarly journals The potential for two-dimensional crystallography of membrane proteins at future x-ray free-electron laser sources

2010 ◽  
Vol 12 (3) ◽  
pp. 035005 ◽  
Author(s):  
Cameron M Kewish ◽  
Pierre Thibault ◽  
Oliver Bunk ◽  
Franz Pfeiffer
Keyword(s):  
Membrane Proteins ◽  
Free Electron ◽  
Free Electron Laser ◽  
Two Dimensional ◽  
X Ray ◽  
Laser Sources

Development of Focusing System for X-Ray Free Electron Laser

2012 ◽  
Vol 516 ◽  
pp. 251-256 ◽  
Author(s):  
Hidekazu Mimura ◽  
Hitoshi Ohmori ◽  
Kazuto Yamauchi
Keyword(s):  
Radiation Damage ◽  
Free Electron ◽  
Free Electron Laser ◽  
Two Dimensional ◽  
Coherent Light ◽  
X Ray ◽  
Synchrotron Facility ◽  
New Type

The X-ray free electron laser (XFEL) is a new type of synchrotron facility, which can produce full coherent light at X-ray wavelength ranges. Its focusing system makes it possible to create an extremely intensive XFEL beam. Long-size focusing mirrors are necessary for this system from the viewpoint of X-ray radiation damage. We established the figuring system with an accuracy at the nanometre level. The focusing mirror has an elliptical curved shape with a length of 400 mm. Figure accuracy with a peak-to-valley height of 2 nm is achieved. The Kirkpatrick Baez focusing system was also designed and developed for two-dimensional focusing at Japanese XFEL.

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