Absolute optical absorption coefficient measurements using transverse photothermal deflection spectroscopy

1983 ◽  
Vol 54 (6) ◽  
pp. 3404-3409 ◽  
Author(s):  
Andreas Mandelis
1995 ◽  
Vol 49 (3) ◽  
pp. 279-285 ◽  
Author(s):  
Bingcheng Li ◽  
Yanzhuo Deng ◽  
Jieke Cheng

The pulsed photothermal deflection spectroscopy (PTDS) method to determine the large optical absorption coefficient from the transverse PTDS magnitude and to measure spectroscopic data of optically dense sample from the normal-to-transverse magnitude ratio of the PTDS signal is presented and has been examined both theoretically and experimentally. Saturation at high absorption, effects of thermal inhomogeneity of the sample, and energy or power fluctuation of both the excitation and probe beams are avoided by this method. Together with the transverse PTDS technique, the dynamic range of spectroscopic measurement is over 9 to 10 orders of magnitude. This technique can be used with sample which is transparent or semitransparent to the probe beam.


1987 ◽  
Vol 6 (2) ◽  
pp. 173-181 ◽  
Author(s):  
F. Borghese ◽  
P. Denti ◽  
R. Saija ◽  
G. Toscano ◽  
O. I. Sindoni

1991 ◽  
Vol 69 (3-4) ◽  
pp. 317-323 ◽  
Author(s):  
Constantinos Christofides ◽  
Andreas Mandelis ◽  
Albert Engel ◽  
Michel Bisson ◽  
Gord Harling

A photopyroelectric spectrometer with real-time and(or) self-normalization capability was used for both conventional transmission and thermal-wave spectroscopic measurements of amorphous Si thin films, deposited on crystalline Si substrates. Optical-absorption-coefficient spectra were obtained from these measurements and the superior dynamic range of the out-of-phase (quadrature) photopyroelectric signal was established as the preferred measurement method, owing to its zero-background compensation capability. An extension of a photopyroelectric theoretical model was established and successfully tested in the determination of the optical absorption coefficient and the thermal diffusivity of the sample under investigation. Instrumental sensitivity limits of βt ≈ 5 × 10−3 were demonstrated.


1996 ◽  
Vol 426 ◽  
Author(s):  
B. Pashmakov ◽  
H. Fritzsche ◽  
B. Claflin

AbstractThe electrical conductance and optical absorption coefficient of microcrystalline indium oxide (c – In2 O 3-x ) can be changed reversibly by several orders of magnitude by photoreduction and reoxidation. Photoreduction is achieved by exposure to ultraviolet light hv ≥ 3.5eV in vacuum or an inert gas. The effects are similar to those previously observed in amorphous In2 O3-x


1990 ◽  
Vol 117-118 ◽  
pp. 473-476 ◽  
Author(s):  
Makoto Yao ◽  
Wataru Hayami ◽  
Hirohisa Endo

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