Effects of preparation conditions and low‐temperature ion irradiation on superconductivity and electrical resistivity of amorphous (Mo0.6Ru0.4)1−xBxfilms

1983 ◽  
Vol 54 (2) ◽  
pp. 722-727 ◽  
Author(s):  
L. Söldner ◽  
H. Adrian ◽  
J. Bieger ◽  
K. Brenner ◽  
C. Nölscher ◽  
...  
2003 ◽  
Vol 802 ◽  
Author(s):  
Michael J. Fluss ◽  
Brian D. Wirth ◽  
Mark Wall ◽  
Thomas E. Felter ◽  
Maria J. Caturla ◽  
...  

ABSTRACTWe earlier reported the measured decrease of electrical resistivity during isochronal-annealing of ion irradiation damage that was accumulated at low-temperature (10 or 20K), and the temperature dependence of the resistance of defect-populations produced by low-temperature damage-accumulation and annealing in a stabilized δ-phase plutonium alloy, Pu(3.3 at%Ga)[1]. We noted that the temperature dependence of the resistance of defects resulting from low-temperature damage accumulation and subsequent annealing exhibits a -ln(T) temperature dependence suggestive of a Kondo impurity. A discussion of a possible “structure-property” effect, as it might relate to the nature of the δ-phase of Pu, is presented.


1980 ◽  
Vol 36 (11) ◽  
pp. 979-982 ◽  
Author(s):  
J. Bieger ◽  
H. Adrian ◽  
P. Müller ◽  
G. Saemann-Ischenko ◽  
E.L. Haase

Physica B+C ◽  
1981 ◽  
Vol 107 (1-3) ◽  
pp. 647-648 ◽  
Author(s):  
H. Adrian ◽  
G. Hertel ◽  
J. Bieger ◽  
G. Saemann-Ischenko ◽  
L. Söldner

2019 ◽  
pp. 15-27
Author(s):  
S. V. Rogozhkin ◽  
◽  
N. A. Iskandarov ◽  
A. A. Nikitin ◽  
A. A. Bogachev ◽  
...  

Alloy Digest ◽  
1960 ◽  
Vol 9 (4) ◽  

Abstract EVANOHM is a nickel-base alloy having low temperature coefficient of resistance and high electrical resistivity. This datasheet provides information on composition, physical properties, hardness, and tensile properties. It also includes information on joining. Filing Code: Ni-57. Producer or source: Wilbur B. Driver Company.


2003 ◽  
Vol 15 (50) ◽  
pp. 8713-8718 ◽  
Author(s):  
J Z Jiang ◽  
W Roseker ◽  
C S Jacobsen ◽  
G F Goya

1981 ◽  
Vol 44 (6) ◽  
pp. 711-729 ◽  
Author(s):  
B. R. Barnard ◽  
A. D. Caplin ◽  
M. N. B. Dalimin

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