Ion beam extraction with ion space‐charge compensation in beam‐plasma type ion source

1982 ◽  
Vol 53 (9) ◽  
pp. 6018-6028 ◽  
Author(s):  
Junzo Ishikawa ◽  
Fumimichi Sano ◽  
Toshinori Takagi
Keyword(s):  
Space Charge ◽  
Ion Beam ◽  
Charge Compensation ◽  
Ion Source ◽  
Beam Extraction ◽  
Beam Plasma

scholarly journals An Ion Source’s View of Its Plasma

Plasma ◽  
2021 ◽  
Vol 4 (2) ◽  
pp. 345-358
Author(s):  
Peter Spädtke
Keyword(s):  
Space Charge ◽  
Ion Beam ◽  
Beam Line ◽  
Beam Intensity ◽  
Beam Extraction ◽  
Beam Plasma ◽  
Initial Plasma ◽  
Experiment And Simulation

Modeling of ion beam extraction from an ECRIS requires special procedures in order to achieve results similar to what is found experimentally. The initial plasma conditions must be included for consistency between experiment and simulation. Space charge forces and their compensation of the extracted ion beam become important with increasing beam intensity. Here we consider the various beam-plasma conditions that occur along any beam line.

scholarly journals Space-charge compensation of highly charged ion beam from laser ion source

1996 ◽  
Vol 14 (3) ◽  
pp. 323-333 ◽  
Author(s):  
S.A. Kondrashev ◽  
J. Collier† ◽  
T. R. Sherwood†
Keyword(s):  
Space Charge ◽  
Current Density ◽  
Ion Beam ◽  
Charge Compensation ◽  
Beam Current ◽  
Ion Source ◽  
Beam Current Density ◽  
Laser Ion Source ◽  
Beam Transport ◽  
Highly Charged Ion

The problem of matching an ion beam delivered by a high-intensity ion source with an accelerator is considered. The experimental results of highly charged ion beam transport with space-charge compensation by electrons are presented. A tungsten thermionic cathode is used as a source of electrons for beam compensation. An increase of ion beam current density by a factor of 25 is obtained as a result of space-charge compensation at a distance of 3 m from the extraction system. The process of ion beam space-charge compensation, requirements for a source of electrons, and the influence of recombination losses in a spacecharge-compensated ion beam are discussed.

Simulation of space charge compensation in a multibeamlet negative ion beam

2016 ◽  
Vol 87 (2) ◽  
pp. 02B917 ◽  
Author(s):  
E. Sartori ◽  
T. J. Maceina ◽  
P. Veltri ◽  
M. Cavenago ◽  
G. Serianni
Keyword(s):  
Space Charge ◽  
Ion Beam ◽  
Charge Compensation ◽  
Negative Ion

Study on space charge compensation in negative hydrogen ion beam

2016 ◽  
Vol 87 (2) ◽  
pp. 02B915 ◽  
Author(s):  
A. L. Zhang ◽  
S. X. Peng ◽  
H. T. Ren ◽  
T. Zhang ◽  
J. F. Zhang ◽  
...  
Keyword(s):  
Space Charge ◽  
Ion Beam ◽  
Charge Compensation ◽  
Hydrogen Ion ◽  
Negative Hydrogen Ion

Space charge compensation of low energy ion beam

2002 ◽  
Vol 73 (2) ◽  
pp. 995-997 ◽  
Author(s):  
V. Dudnikov ◽  
A. Dudnikov
Keyword(s):  
Space Charge ◽  
Ion Beam ◽  
Charge Compensation ◽  
Low Energy

Analysis of the Effect of Beam Divergence Angle on Back-Streaming Electron Region in Ion Source for EAST-Neutral Beam Injection

2018 ◽  
Vol 4 (3) ◽  
Author(s):  
Hu Chundong ◽  
Wu Mingshan ◽  
Xie Yahong ◽  
Wei Jianglong ◽  
Yu Ling
Keyword(s):  
Ion Beam ◽  
Ion Source ◽  
Neutral Beam Injection ◽  
Beam Divergence ◽  
Neutral Beam ◽  
Divergence Angle ◽  
Beam Extraction ◽  
Beam Injection ◽  
Back Plate ◽  
Beam Divergence Angle

During the process of beam extraction in positive ion source under high voltage region, a large number of electrons are produced in the gaps of grids. After back-streaming acceleration, these electrons go back to arc chamber or impinge grids and then heat back plate or grids, which are harmful for the safety of ion source. Under the situation of poor beam extraction optics, a large part of the primary beam ions bombard the surface of suppressor grid (SG). And this process produces a large number of electrons. Due to the huge extracted voltage, the secondary electron emission coefficient of the SG surface is also high. As a result, the grids' current grows. According to the measurement of the current of SG and the calculation of the perveance of the corresponding shoot, the effect of ion beam divergence angle on back-streaming electrons can be analyzed. When the beam divergence angle increases, the number of back-streaming electrons increases rapidly, and grids' current changes significantly, especially the current of gradient grid and SG. The results can guide the parameters operating on the ion source for Experimental Advanced Superconducting Tokamak-neutral beam injection (EAST-NBI) and find the reasonable operation interval of perveance and to ensure the safety and stable running of the ion source, which has great significance on the development of long pulse, high power ion source.

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