Plasma‐hydrogenation effects on conductivity and electron spin resonance in undoped polycrystalline silicon

1982 ◽  
Vol 53 (7) ◽  
pp. 5022-5027 ◽  
Author(s):  
S. Hasegawa ◽  
S. Takenaka ◽  
Y. Kurata
2010 ◽  
Vol 207 (3) ◽  
pp. 570-573 ◽  
Author(s):  
M. Weizman ◽  
L.-P. Scheller ◽  
N. H. Nickel ◽  
K. Lips ◽  
B. Yan

1986 ◽  
Vol 49 (23) ◽  
pp. 1620-1622 ◽  
Author(s):  
Dominique Ballutaud ◽  
Marc Aucouturier ◽  
Florence Babonneau

2003 ◽  
Vol 762 ◽  
Author(s):  
K. Brendel ◽  
N. H. Nickel ◽  
K. Lips ◽  
W. Fuhs

AbstractDoped and undoped laser crystallized polycrystalline silicon was investigated by electron-spin-resonance experiments. In P-doped samples two resonance are detected at g = 2.0053 and g = 1.998 which are due to silicon dangling bonds and conducting electrons, respectively. After crystallization a large amount of hydrogen remains in the samples. This residual hydrogen can be activated to reduce the spin density by passivating dangling-bonds. The temperature dependent investigation of the conducting electron resonance reveals that the susceptibility can be described by the sum of Pauli and Curie paramagnetism. The data are discussed in terms of models developed for single crystal and microcrystalline silicon.


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