Dielectric microwave characterizations of (Ba,Sr)TiO3 film deposited on high resistivity silicon substrate: Analysis by two-dimensional tangential finite element method

2010 ◽  
Vol 107 (5) ◽  
pp. 054112 ◽  
Author(s):  
F. Ponchel ◽  
J. Midy ◽  
J. F. Legier ◽  
C. Soyer ◽  
D. Rémiens ◽  
...  
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