Reduction of electron trapping in silicon dioxide by high‐temperature nitrogen anneal
2007 ◽
Vol 20
(11)
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pp. S380-S384
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2012 ◽
Vol 502
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pp. 116-119
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2011 ◽
Vol 295-297
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pp. 282-285
Keyword(s):
2010 ◽
Vol 663-665
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pp. 429-433
Keyword(s):
2017 ◽
Vol 9
(1)
◽
pp. 30-34
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2016 ◽
Vol 868
◽
pp. 38-42
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Keyword(s):
1972 ◽
Vol 33
(12)
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pp. 2197-2216
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