Nanoscale domain growth dynamics of ferroelectric poly(vinylidene fluoride-co-trifluoroethylene) thin films

2010 ◽  
Vol 96 (1) ◽  
pp. 012908 ◽  
Author(s):  
Yunseok Kim ◽  
Wooyoung Kim ◽  
Hyunwoo Choi ◽  
Seungbum Hong ◽  
Hyungsoo Ko ◽  
...  
2019 ◽  
Vol 54 (15) ◽  
pp. 10600-10608 ◽  
Author(s):  
Jiayu Pan ◽  
Tianlu Men ◽  
Xingyu Xu ◽  
Ze Xu ◽  
Qi Li ◽  
...  

2017 ◽  
Vol 43 (12) ◽  
pp. 9538-9542 ◽  
Author(s):  
Tian-Lu Men ◽  
Hao Cheng Thong ◽  
Jun-Tao Li ◽  
Mo Li ◽  
Jian Zhang ◽  
...  

2001 ◽  
Vol 665 ◽  
Author(s):  
Feng Xia ◽  
H.S. Xu ◽  
Babak Razavi ◽  
Q. M. Zhang

ABSTRACTFerroelectric polymer thin films are attractive for a wide range of applications such as MEMS, IR sensors, and memory devices. We present the results of a recent investigation on the thickness dependence of the ferroelectric properties of poly(vinylidene fluoridetrifluoroethylene) copolymer spin cast films on electroded Si substrate. We show that as the film thickness is reduced, there exist two thickness regions. For films at thickness above 100 nm, the thickness dependence of the ferroelectric properties can be attributed to the interface effect. However, for thinner films, there is a large change in the ferroelectric properties such as the polarization level, the coercive field, and polarization switching speed, which is related to the large drop of the crystallinity in the ultrathin film region (below 100 nm). The results from Xray, dielectric measurement, and AFM all indicate that there is a threshold thickness at about 100 nm below which the crystallinity in the film reduces abruptly.


2010 ◽  
Vol 519 (4) ◽  
pp. 1441-1444 ◽  
Author(s):  
Sharon Roslyn Oh ◽  
Kui Yao ◽  
Choi Lan Chow ◽  
Francis Eng Hock Tay

2020 ◽  
Vol 52 (12) ◽  
pp. 1150-1155
Author(s):  
Sabine Apelt ◽  
Susanne Höhne ◽  
Petra Uhlmann ◽  
Ute Bergmann

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