Three-dimensional shapes and distribution of FePd nanoparticles observed by electron tomography using high-angle annular dark-field scanning transmission electron microscopy

2010 ◽  
Vol 107 (2) ◽  
pp. 024304 ◽  
Author(s):  
Kazuhisa Sato ◽  
Kenta Aoyagi ◽  
Toyohiko J. Konno
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Electron Tomography ◽  
Three Dimensional ◽  
Dark Field ◽  
High Angle ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Annular Dark Field

High-Angle Annular Dark Field Scanning Transmission Electron Microscopy on Carbon-Based Functional Polymer Systems

2009 ◽  
Vol 15 (3) ◽  
pp. 251-258 ◽  
Author(s):  
Erwan Sourty ◽  
Svetlana van Bavel ◽  
Kangbo Lu ◽  
Ralph Guerra ◽  
Georg Bar ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Dark Field ◽  
High Angle ◽  
Functional Polymer ◽  
Polymer Systems ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Annular Dark Field

AbstractTwo purely carbon-based functional polymer systems were investigated by bright-field conventional transmission electron microscopy (CTEM) and high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM). For a carbon black (CB) filled polymer system, HAADF-STEM provides high contrast between the CB agglomerates and the polymer matrix so that details of the interface organization easily can be revealed and assignment of the CB phase is straightforward. For a second system, the functional polymer blend representing the photoactive layer of a polymer solar cell, details of its nanoscale organization could be observed that were not accessible with CTEM. By varying the camera length in HAADF-STEM imaging, the contrast can be enhanced between crystalline and amorphous compounds due to diffraction contrast so that nanoscale interconnections between domains are identified. In general, due to its incoherent imaging characteristics HAADF-STEM allows for reliable interpretation of the data obtained.

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