Pulsed‐laser atom‐probe field‐ion microscopy

G. L. Kellogg; T. T. Tsong

doi:10.1063/1.327686

Pulsed‐laser atom‐probe field‐ion microscopy

Journal of Applied Physics ◽

10.1063/1.327686 ◽

1980 ◽

Vol 51 (2) ◽

pp. 1184-1193 ◽

Cited By ~ 311

Author(s):

G. L. Kellogg ◽

T. T. Tsong

Keyword(s):

Pulsed Laser ◽

Atom Probe ◽

Probe Field ◽

Field Ion Microscopy ◽

Ion Microscopy

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AN ATOM PROBE FIELD ION MICROSCOPY STUDY OF DISLOCATION-SOLUTE INTERACTIONS NEAR TWIN BOUNDARIES IN WEB SILICON

Le Journal de Physique Colloques ◽

10.1051/jphyscol:1988685 ◽

1988 ◽

Vol 49 (C6) ◽

pp. C6-503-C6-507 ◽

Cited By ~ 2

Author(s):

R. JAYARAM ◽

J. A. SPITZNAGEL

Keyword(s):

Atom Probe ◽

Microscopy Study ◽

Twin Boundaries ◽

Probe Field ◽

Field Ion Microscopy ◽

Solute Interactions ◽

Ion Microscopy

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Field ion microscopy and pulsed laser atom-probe mass spectroscopy of insulating glasses

Vacuum ◽

10.1016/0042-207x(85)90294-5 ◽

1985 ◽

Vol 35 (8) ◽

pp. 345

Keyword(s):

Mass Spectroscopy ◽

Pulsed Laser ◽

Atom Probe ◽

Field Ion Microscopy ◽

Ion Microscopy

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Microstructural development in PWA-1480 electron beam welds — an atom probe field ion microscopy study

Applied Surface Science ◽

10.1016/0169-4332(95)00387-8 ◽

1996 ◽

Vol 94-95 ◽

pp. 280-287 ◽

Cited By ~ 9

Author(s):

S.S. Babu ◽

S.A. David ◽

M.K. Miller

Keyword(s):

Electron Beam ◽

Atom Probe ◽

Microscopy Study ◽

Microstructural Development ◽

Probe Field ◽

Field Ion Microscopy ◽

Ion Microscopy

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Study on titanium carbide field emitters by field-ion microscopy, field-electron emission microscopy, auger electron spectroscopy, and atom-probe field-ion microscopy

Surface Science Letters ◽

10.1016/0167-2584(82)90422-4 ◽

1982 ◽

Vol 120 (1) ◽

pp. A329

Author(s):

M. Futamoto ◽

I. Yuito ◽

U. Kawabe ◽

O. Nishikawa ◽

Y. Tsunashima ◽

...

Keyword(s):

Titanium Carbide ◽

Electron Emission ◽

Electron Spectroscopy ◽

Auger Electron ◽

Atom Probe ◽

Probe Field ◽

Field Ion Microscopy ◽

Field Emitters ◽

Emission Microscopy ◽

Ion Microscopy

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Chemical Homogeneity of NiPdP Metallic Glasses Studied by Atom Probe-Field Ion Microscopy / Feldionenmikroskop- und Atomsonden-Untersuchungen zur chemischen Homogenität metallener NiPdP-Gläser

International Journal of Materials Research (formerly Zeitschrift fuer Metallkunde) ◽

10.1515/ijmr-1989-800101 ◽

1989 ◽

Vol 80 (1) ◽

pp. 1-8

Author(s):

Michael Oehring

Keyword(s):

Metallic Glasses ◽

Atom Probe ◽

Probe Field ◽

Chemical Homogeneity ◽

Field Ion Microscopy ◽

Ion Microscopy

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Atom-probe field ion microscopy

Microchimica Acta ◽

10.1007/bf01244464 ◽

1992 ◽

Vol 107 (3-6) ◽

pp. 95-104 ◽

Cited By ~ 2

Author(s):

Manfred Leisch

Keyword(s):

Atom Probe ◽

Probe Field ◽

Field Ion Microscopy ◽

Ion Microscopy

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A controlled specimen preparation technique for interface studies with atom-probe field-ion microscopy

Journal of Physics E Scientific Instruments ◽

10.1088/0022-3735/16/7/014 ◽

1983 ◽

Vol 16 (7) ◽

pp. 617-619 ◽

Cited By ~ 45

Author(s):

A Henjered ◽

H Norden

Keyword(s):

Atom Probe ◽

Specimen Preparation ◽

Preparation Technique ◽

Probe Field ◽

Field Ion Microscopy ◽

Ion Microscopy

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Atom Probe-Field Ion Microscopy and Mössbauer Spectroscopy of Low Temperature Phase Decomposition in a Ferritic Stainless Steel

Materials Transactions JIM ◽

10.2320/matertrans1989.36.16 ◽

1995 ◽

Vol 36 (1) ◽

pp. 16-22 ◽

Cited By ~ 3

Author(s):

Yuichi Ishikawa ◽

Toshihiko Yoshimura ◽

Atsushi Moriai ◽

Hisashi Kuwano

Keyword(s):

Stainless Steel ◽

Low Temperature ◽

Ferritic Stainless Steel ◽

Atom Probe ◽

Temperature Phase ◽

Phase Decomposition ◽

Probe Field ◽

Field Ion Microscopy ◽

Ion Microscopy ◽

Low Temperature Phase

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Direct measurement of carbon solubility in the intermetallic (Fe,Cr)2(Mo,W) Laves phase using atom-probe field-ion microscopy

Scripta Materialia ◽

10.1016/1359-6462(95)00569-2 ◽

1996 ◽

Vol 34 (5) ◽

pp. 741-747 ◽

Cited By ~ 23

Author(s):

L.M. Lundin

Keyword(s):

Direct Measurement ◽

Atom Probe ◽

Laves Phase ◽

Carbon Solubility ◽

Probe Field ◽

Field Ion Microscopy ◽

Ion Microscopy

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Atom Probe Field-Ion Microscopy Characterization of Nickel and Titanium Aluminides

Materials Characterization ◽

10.1016/s1044-5803(99)00049-2 ◽

2000 ◽

Vol 44 (1-2) ◽

pp. 159-176 ◽

Cited By ~ 15

Author(s):

D.J Larson ◽

M.K Miller

Keyword(s):

Titanium Aluminides ◽

Atom Probe ◽

Probe Field ◽

Field Ion Microscopy ◽

Ion Microscopy ◽

Microscopy Characterization

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