Secondary ion mass spectrometry and ion scattering spectrometry determination of iodide distribution in Ag(Br,I)

B. K. Furman; G. H. Morrison; V. I. Saunders; Y. T. Tan

doi:10.1063/1.327448

Secondary ion mass spectrometry and ion scattering spectrometry determination of iodide distribution in Ag(Br,I)

Journal of Applied Physics ◽

10.1063/1.327448 ◽

1980 ◽

Vol 51 (10) ◽

pp. 5342 ◽

Cited By ~ 8

Author(s):

B. K. Furman ◽

G. H. Morrison ◽

V. I. Saunders ◽

Y. T. Tan

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Scattering ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Secondary ion mass spectrometry and ion scattering spectrometry determination of iodide distribution in Ag(Br,I)

Vacuum ◽

10.1016/s0042-207x(81)80427-7 ◽

1981 ◽

Vol 31 (4-5) ◽

pp. 212

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Ion Scattering ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials

10.3403/02007712 ◽

2000 ◽

Keyword(s):

Mass Spectrometry ◽

Chemical Analysis ◽

Secondary Ion Mass Spectrometry ◽

Surface Chemical ◽

Atomic Concentration ◽

Ion Mass Spectrometry ◽

Doped Materials ◽

Secondary Ion ◽

Surface Chemical Analysis

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Surface chemical analysis. Secondary-ion mass spectrometry. Determination of boron atomic concentration in silicon using uniformly doped materials

10.3403/30153671 ◽

2010 ◽

Keyword(s):

Mass Spectrometry ◽

Chemical Analysis ◽

Secondary Ion Mass Spectrometry ◽

Surface Chemical ◽

Atomic Concentration ◽

Ion Mass Spectrometry ◽

Doped Materials ◽

Secondary Ion ◽

Surface Chemical Analysis

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Analysis of SnNi Electroplate by Secondary Ion Mass Spectrometry, Ion Scattering Spectrometry, and Rutherford Backscattering

Journal of The Electrochemical Society ◽

10.1149/1.2131652 ◽

1978 ◽

Vol 125 (8) ◽

pp. 1215-1218 ◽

Cited By ~ 6

Author(s):

Rudolf Schubert

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Rutherford Backscattering ◽

Ion Scattering ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Determination of concentration in depth profiles of thin films with Secondary Ion Mass Spectrometry

Vacuum ◽

10.1016/s0042-207x(76)81117-7 ◽

1976 ◽

Vol 26 (3) ◽

pp. 130

Keyword(s):

Mass Spectrometry ◽

Thin Films ◽

Secondary Ion Mass Spectrometry ◽

Depth Profiles ◽

Ion Mass Spectrometry ◽

Secondary Ion

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SURFACE ANALYSIS OF POLYSTYRENE LATEXES BY ION SCATTERING SPECTROSCOPY AND SECONDARY ION MASS SPECTROMETRY

Journal of Dispersion Science and Technology ◽

10.1080/01932698108943913 ◽

1981 ◽

Vol 2 (2-3) ◽

pp. 267-280 ◽

Cited By ~ 7

Author(s):

Charles C. Fifield ◽

Robert M. Fitch

Keyword(s):

Mass Spectrometry ◽

Surface Analysis ◽

Secondary Ion Mass Spectrometry ◽

Ion Scattering ◽

Ion Scattering Spectroscopy ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Characterization of S-glass/polysulfone adhesive failure using ion scattering spectroscopy and secondary ion mass spectrometry

Journal of Colloid and Interface Science ◽

10.1016/0021-9797(80)90178-2 ◽

1980 ◽

Vol 74 (1) ◽

pp. 150-162 ◽

Cited By ~ 26

Author(s):

Anthony T Dibenedetto ◽

Daniel A Scola

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Adhesive Failure ◽

Ion Scattering ◽

Ion Scattering Spectroscopy ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Abstract: Surface analytical studies using ion scattering spectrometry, Auger electron spectroscopy and secondary ion mass spectrometry

Journal of Vacuum Science and Technology ◽

10.1116/1.568786 ◽

1975 ◽

Vol 12 (1) ◽

pp. 352-353 ◽

Cited By ~ 6

Author(s):

W. Heiland ◽

E. Taglauer

Keyword(s):

Mass Spectrometry ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Secondary Ion Mass Spectrometry ◽

Ion Scattering ◽

Analytical Studies ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Time-of-Flight-Secondary Ion Mass Spectrometry and Principal Component Analysis: Determination of Structures of Lamellar Surfaces

Analytical Chemistry ◽

10.1021/ac902280h ◽

2010 ◽

Vol 82 (7) ◽

pp. 2661-2667 ◽

Cited By ~ 17

Author(s):

Yiu-Ting R. Lau ◽

Lu-Tao Weng ◽

Kai-Mo Ng ◽

Chi-Ming Chan

Keyword(s):

Mass Spectrometry ◽

Principal Component Analysis ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Principal Component ◽

Component Analysis ◽

Ion Mass Spectrometry ◽

Secondary Ion ◽

Analysis Determination

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Determination of Isotope Ratios of Calcium and Iron in Human Blood by Secondary Ion Mass Spectrometry

Springer Series in Chemical Physics - Secondary Ion Mass Spectrometry SIMS II ◽

10.1007/978-3-642-61871-0_72 ◽

1979 ◽

pp. 245-247 ◽

Cited By ~ 6

Author(s):

K. Wittmaack ◽

F. Schulz ◽

E. Werner

Keyword(s):

Mass Spectrometry ◽

Human Blood ◽

Secondary Ion Mass Spectrometry ◽

Isotope Ratios ◽

Ion Mass Spectrometry ◽

Secondary Ion

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