Observation of anodic oxide‐film growth on GaAs byinsitudifferential reflectance

1977 ◽  
Vol 48 (6) ◽  
pp. 2638-2640 ◽  
Author(s):  
A. Moritani ◽  
H. Kubo ◽  
J. Nakai
Keyword(s):  
Oxide Film ◽  
Film Growth ◽  
Anodic Oxide ◽  
Anodic Oxide Film

Diagnosis of the Mechanism of Anodic Oxide Film Growth on Platinum in H2SO4

2014 ◽  
Vol 161 (5) ◽  
pp. C254-C260 ◽  
Author(s):  
Feixiong Mao ◽  
Samin Sharifi-Asl ◽  
Jingkun Yu ◽  
Digby D. Macdonald
Keyword(s):  
Oxide Film ◽  
Film Growth ◽  
Anodic Oxide ◽  
Anodic Oxide Film

Anodic oxide film growth on thin magnetron sputter-deposited titanium layer

2014 ◽  
Vol 98 ◽  
pp. 102-106 ◽  
Author(s):  
Z. Liu ◽  
H. Liu ◽  
T. Hashimoto ◽  
G.E. Thompson ◽  
P. Skeldon
Keyword(s):  
Oxide Film ◽  
Film Growth ◽  
Anodic Oxide ◽  
Anodic Oxide Film ◽  
Titanium Layer ◽  
Magnetron Sputter ◽  
Sputter Deposited

Diagnosis of the Mechanism of Anodic Oxide Film Growth on Platinum in KOH

2016 ◽  
Vol 230 (1) ◽  
Author(s):  
Feixiong Mao ◽  
Pin Lu ◽  
Digby D. Macdonald
Keyword(s):  
Oxide Film ◽  
Electric Field ◽  
Layer Thickness ◽  
Diagnostic Criteria ◽  
Barrier Layer ◽  
Applied Voltage ◽  
Film Growth ◽  
Anodic Oxide ◽  
Anodic Oxide Film ◽  
Barrier Layer Thickness

AbstractDiagnostic criteria for growth of the anodic oxide film on platinum in KOH are reported. In this work, the analytical analysis of oxide film growth demonstrated that the electric field in the passive film formed anodically on platinum in KOH is constant, independent of the applied voltage and barrier layer thickness. This criterion intrinsically distinguishes the Point Defect Model (PDM) from the High Field Model (HFM). Unequivocally, the PDM provides a superior theoretical framework than does the HFM for interpreting oxide film growth on platinum. Importantly, we argue that the diagnostic criteria also apply to metal interstitial conduction, which is the mechanism proposed in the HFM for formation of the PtO oxide film on platinum, but with film growth occurring at the film/solution interface and with a thickness-dependent electric field, rather than being restricted to oxygen vacancy conductors alone, as originally derived for the PDM. Thus, the ability of the diagnostic criteria to differentiate between the HFM and the PDM, in this case, is a direct assessment of the dependence of the electric field strength on the applied voltage and barrier layer thickness, with the experimental results coming down unequivocally on the side of the PDM.

scholarly journals Evaluation of bone-implant interfaces on iso5832-9 and ti6al4v alloys after thin-anodic oxide film growth

2016 ◽  
Author(s):  
T. C. da Costa ◽  
L. A. Taminato ◽  
A. R. S. Gomes ◽  
H. A. Ponte ◽  
C. E. B. Marino
Keyword(s):  
Oxide Film ◽  
Film Growth ◽  
Anodic Oxide ◽  
Anodic Oxide Film ◽  
Bone Implant
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