Electrical properties and conduction mechanisms of Ru‐based thick‐film (cermet) resistors

1977 ◽  
Vol 48 (12) ◽  
pp. 5152-5169 ◽  
Author(s):  
G. E. Pike ◽  
C. H. Seager
Keyword(s):  
Electrical Properties ◽  
Thick Film ◽  
Conduction Mechanisms

scholarly journals Electrical Transport in Thick Film (Cermet) Resistors

1983 ◽  
Vol 10 (4) ◽  
pp. 285-293 ◽  
Author(s):  
Maria Prudenziati
Keyword(s):  
Electrical Properties ◽  
Thick Film ◽  
Electrical Transport ◽  
Research Groups ◽  
Conduction Mechanisms ◽  
Available Information

Though for many decades have we had thick-film resistors (TFRs) with good electrical properties, no well established model for describing their conduction mechanisms has been achieved. However the efforts of some research groups in U.S.A. and Europe in the last years have had success in improving our knowledge of the microstructure and of a large spectrum of electrical properties of TFRs. The available information narrows the field of possibilities for conduction mechanisms in TFRs. Though no conclusive assessment is yet possible, some lines for further progress can be precisely delineated.

Electrical properties of BaFe0.9Sn0.1O3–BaCoII0.02CoIII0.04Bi0.94O3 composite thick-film thermistors

Rare Metals ◽  
2014 ◽  
Vol 39 (11) ◽  
pp. 1321-1327
Author(s):  
Chang-Lai Yuan ◽  
Ying Luo ◽  
Qin Feng ◽  
Yun Yang ◽  
Xiu-Juan Zhou ◽  
...  
Keyword(s):  
Electrical Properties ◽  
Thick Film

Structural and electrical properties of thick film thermistors based on perovskite La–Mn–Al–O

2014 ◽  
Vol 40 (7) ◽  
pp. 10505-10510 ◽  
Author(s):  
Xinqian Xiong ◽  
Jinbao Xu ◽  
Pengjun Zhao ◽  
Lei Wang ◽  
Liang Bian ◽  
...  
Keyword(s):  
Electrical Properties ◽  
Thick Film ◽  
Structural And Electrical Properties

High-performance electrical properties of La-based perovskite ceramics for the functional phase of thick film resistors

2020 ◽  
Author(s):  
Yongcheng Lu ◽  
Yuanxun Li ◽  
Daming Chen ◽  
Rui Peng ◽  
Qinghui Yang ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Electrical Properties ◽  
Thick Film ◽  
High Performance ◽  
Composite Ceramics ◽  
X Ray Diffraction ◽  
X Ray ◽  
Alternative Material ◽  
Perovskite Ceramics ◽  
Scanning Electron

Abstract In order to explore an economical functional phase alternative material for thick film resistors, the crystal structure, microstructure, and electrical properties of (1-x)LSCN + xLCNZ (x = 0.0–1.0) composite ceramics were studied through solid-state reaction experiments. The composite ceramics were characterized by x–ray diffraction, scanning electron microscopy, energy dispersive x–ray spectroscopy, and DC four–probe method. Results suggested that the main phases of LSCN and LCNZ were formed, along with a small part of impurity phases. The addition of LCNZ to LSCN decreased the electrical conductivity and changed the TCR from positive to negative. Zero TCR could be achieved around 0.6 < x < 0.8 and relatively low absolute TCR values could be obtained for the samples of 0.4 ≤ x ≤ 0.8. The ceramic of 0.6LSCN + 0.4LCNZ showed the optimal performances of conductivity = 1923 S/cm, TCR = 379.54 ppm/℃, and relative density = 95.05%.

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