Electron‐beam and photolithographic fabrication of guided‐wave optical components

1977 ◽  
Vol 48 (10) ◽  
pp. 4149-4151 ◽  
Author(s):  
R. L. Aagard ◽  
L. T. Shepherd ◽  
R. P. Ulmer
Keyword(s):  
Electron Beam ◽  
Guided Wave ◽  
Optical Components

Modulation of the Optical Guided Wave by uv Light and Electron Beam Excitations

1973 ◽  
Vol 10 (6) ◽  
pp. 941-943 ◽  
Author(s):  
Koichi Toyoda ◽  
Susumu Namba ◽  
Toshiaki Matsui ◽  
Yoshio Suge
Keyword(s):  
Electron Beam ◽  
Uv Light ◽  
Guided Wave

Implementation of photomasks for guided wave optical components by a step-and-repeat process

1981 ◽  
Vol 3 (4) ◽  
pp. 401-411
Author(s):  
D. Hoffmann ◽  
U. Langmann ◽  
W. Oppermann
Keyword(s):  
Guided Wave ◽  
Optical Components

Techniques for Transmission Electron Microscopy of Fiber-Matrix Interfaces in Aluminum Alloy-Boron Composites by Ion Erosio

1971 ◽  
Vol 29 ◽  
pp. 204-205
Author(s):  
G. G. Shaw
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Aluminum Alloy ◽  
Electron Beam ◽  
Pure Aluminum ◽  
Ion Milling ◽  
Transmission Electron ◽  
Fiber Matrix ◽  
Ion Erosion ◽  
Row Of Fibers

The morphology and composition of the fiber-matrix interface can best be studied by transmission electron microscopy and electron diffraction. For some composites satisfactory samples can be prepared by electropolishing. For others such as aluminum alloy-boron composites ion erosion is necessary.When one wishes to examine a specimen with the electron beam perpendicular to the fiber, preparation is as follows: A 1/8 in. disk is cut from the sample with a cylindrical tool by spark machining. Thin slices, 5 mils thick, containing one row of fibers, are then, spark-machined from the disk. After spark machining, the slice is carefully polished with diamond paste until the row of fibers is exposed on each side, as shown in Figure 1.In the case where examination is desired with the electron beam parallel to the fiber, preparation is as follows: Experimental composites are usually 50 mils or less in thickness so an auxiliary holder is necessary during ion milling and for easy transfer to the electron microscope. This holder is pure aluminum sheet, 3 mils thick.

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