scholarly journals Wavelength dependence of the damage threshold of inorganic materials under extreme-ultraviolet free-electron-laser irradiation

2009 ◽  
Vol 95 (11) ◽  
pp. 111104 ◽  
Author(s):  
S. P. Hau-Riege ◽  
R. A. London ◽  
R. M. Bionta ◽  
D. Ryutov ◽  
R. Soufli ◽  
...  
2015 ◽  
Vol 23 (22) ◽  
pp. 29032 ◽  
Author(s):  
Jangwoo Kim ◽  
Ayaka Nagahira ◽  
Takahisa Koyama ◽  
Satoshi Matsuyama ◽  
Yasuhisa Sano ◽  
...  

2007 ◽  
Vol 90 (17) ◽  
pp. 173128 ◽  
Author(s):  
S. P. Hau-Riege ◽  
R. A. London ◽  
R. M. Bionta ◽  
M. A. McKernan ◽  
S. L. Baker ◽  
...  

2007 ◽  
Author(s):  
S Hau-Riege ◽  
R London ◽  
R Bionta ◽  
M McKernan ◽  
S Baker ◽  
...  

Photonics ◽  
2020 ◽  
Vol 7 (2) ◽  
pp. 35
Author(s):  
Sumana Raj ◽  
Shane Devlin ◽  
Riccardo Mincigrucci ◽  
Craig Schwartz ◽  
Emiliano Principi ◽  
...  

Ultrafast time-resolved extreme ultraviolet (EUV) reflectivity measurements of optically pumped amorphous carbon (a-C) have been performed with the FERMI free electron laser (FEL). This work extends the energy range used in previous reflectivity studies and adds polarization dependence. The EUV probe is known to be sensitive to lattice dynamics, since in this range the reflectivity is essentially unaffected by the photo-excited surface plasma. The exploitation of both s- and p-polarized EUV radiation permits variation of the penetration depth of the probe; a significant increase in the characteristic time is observed upon increasing the probing depth (1 vs. 5 ps) due to hydrodynamic expansion and consequent destruction of the excited region, implying that there is only a short window during which the probed region is in the isochoric regime. A weak wavelength dependence of the reflectivity is found, consistent with previous measurements and implying a maximum electronic temperature of 0.8 eV ± 0.4.


2010 ◽  
Vol 130 (2) ◽  
pp. 209-212 ◽  
Author(s):  
Daisuke Ishizuka ◽  
Keijiro Sakai ◽  
Nobuyuki Iwata ◽  
Hirofumi Yajima ◽  
Hiroshi Yamamoto

2021 ◽  
Author(s):  
Najmeh S. Mirian ◽  
Michele Di Fraia ◽  
Simone Spampinati ◽  
Filippo Sottocorona ◽  
Enrico Allaria ◽  
...  

2021 ◽  
Vol 12 (1) ◽  
Author(s):  
Thomas Ding ◽  
Marc Rebholz ◽  
Lennart Aufleger ◽  
Maximilian Hartmann ◽  
Veit Stooß ◽  
...  

AbstractHigh-intensity ultrashort pulses at extreme ultraviolet (XUV) and x-ray photon energies, delivered by state-of-the-art free-electron lasers (FELs), are revolutionizing the field of ultrafast spectroscopy. For crossing the next frontiers of research, precise, reliable and practical photonic tools for the spectro-temporal characterization of the pulses are becoming steadily more important. Here, we experimentally demonstrate a technique for the direct measurement of the frequency chirp of extreme-ultraviolet free-electron laser pulses based on fundamental nonlinear optics. It is implemented in XUV-only pump-probe transient-absorption geometry and provides in-situ information on the time-energy structure of FEL pulses. Using a rate-equation model for the time-dependent absorbance changes of an ionized neon target, we show how the frequency chirp can be directly extracted and quantified from measured data. Since the method does not rely on an additional external field, we expect a widespread implementation at FELs benefiting multiple science fields by in-situ on-target measurement and optimization of FEL-pulse properties.


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