200 MeV silver ion irradiation induced structural modification in YBa2Cu3O7−y thin films at 89 K: An in situ x-ray diffraction study

2009 ◽  
Vol 106 (5) ◽  
pp. 053912 ◽  
Author(s):  
R. Biswal ◽  
J. John ◽  
P. Mallick ◽  
B. N. Dash ◽  
P. K. Kulriya ◽  
...  
Keyword(s):  
Thin Films ◽  
Diffraction Study ◽  
Structural Modification ◽  
Ion Irradiation ◽  
Silver Ion ◽  
X Ray Diffraction ◽  
X Ray

In situ X-ray diffraction study of the controlled oxidation and reduction in the V–O system for the synthesis of VO2 and V2O3 thin films

2015 ◽  
Vol 3 (43) ◽  
pp. 11357-11365 ◽  
Author(s):  
Geert Rampelberg ◽  
Bob De Schutter ◽  
Wouter Devulder ◽  
Koen Martens ◽  
Iuliana Radu ◽  
...  
Keyword(s):  
Thin Films ◽  
Diffraction Study ◽  
Resistance Switching ◽  
X Ray Diffraction ◽  
X Ray

VO2 and V2O3 thin films were prepared during in situ XRD investigation by oxidation and reduction of V and V2O5. Films show up to 5 orders of magnitude resistance switching.

In situ X-ray diffraction study of crystallization process of GeSbTe thin films during heat treatment

2005 ◽  
Vol 244 (1-4) ◽  
pp. 281-284 ◽  
Author(s):  
Naohiko Kato ◽  
Ichiro Konomi ◽  
Yoshiki Seno ◽  
Tomoyoshi Motohiro
Keyword(s):  
Thin Films ◽  
Heat Treatment ◽  
Diffraction Study ◽  
Crystallization Process ◽  
X Ray Diffraction ◽  
X Ray

In-situ x-ray diffraction study of the growth of highly strained epitaxial BaTiO3 thin films

2013 ◽  
Vol 103 (24) ◽  
pp. 242904 ◽  
Author(s):  
J. Sinsheimer ◽  
S. J. Callori ◽  
B. Ziegler ◽  
B. Bein ◽  
P. V. Chinta ◽  
...  
Keyword(s):  
Thin Films ◽  
Diffraction Study ◽  
X Ray Diffraction ◽  
X Ray ◽  
Highly Strained

scholarly journals Online in situ x-ray diffraction setup for structural modification studies during swift heavy ion irradiation

2012 ◽  
Vol 83 (1) ◽  
pp. 013902 ◽  
Author(s):  
C. Grygiel ◽  
H. Lebius ◽  
S. Bouffard ◽  
A. Quentin ◽  
J. M. Ramillon ◽  
...  
Keyword(s):  
Structural Modification ◽  
Ion Irradiation ◽  
Heavy Ion ◽  
X Ray Diffraction ◽  
Swift Heavy Ion Irradiation ◽  
X Ray ◽  
Heavy Ion Irradiation ◽  
Swift Heavy Ion

Structural Evolution of Amorphous Ge2Sb2Te5 Thin Films in the Transition to the Crystalline Phase

2008 ◽  
Vol 1072 ◽  
Author(s):  
Riccardo De Bastiani ◽  
Alberto Maria Piro ◽  
Maria Grazia Grimaldi ◽  
Emanuele Rimini ◽  
Giuseppe Baratta ◽  
...  
Keyword(s):  
Thin Films ◽  
Crystalline Phase ◽  
Short Range ◽  
Structural Modification ◽  
Structural Evolution ◽  
X Ray Diffraction ◽  
Time Resolved ◽  
X Ray ◽  
Kinetics Of

ABSTRACTThe crystallization kinetics of as-deposited amorphous Ge2Sb2Te5 thin films has been measured by in situ time resolved reflectivity. X-ray diffraction and Raman scattering analyses of partially transformed samples allowed to correlate the evolution of the transition to the structural modification in the long and short range configuration. The experimental results evidenced that during the early stages of crystallization there is a reduction of Ge-Te tetrahedral bonds, characteristics of the Ge coordination in amorphous Ge2Sb2Te5 films.

In-situ synchrotron X-ray diffraction study of stress-induced phase transformation in Ti50.1Ni40.8Cu9.1 thin films

2012 ◽  
Vol 407 (17) ◽  
pp. 3437-3440 ◽  
Author(s):  
H. Wang ◽  
G.A. Sun ◽  
B. Chen ◽  
Y.Q. Fu ◽  
X.L. Wang ◽  
...  
Keyword(s):  
Thin Films ◽  
Phase Transformation ◽  
Diffraction Study ◽  
X Ray Diffraction ◽  
X Ray
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