Nonuniform doping distribution along silicon nanowires measured by Kelvin probe force microscopy and scanning photocurrent microscopy

2009 ◽  
Vol 95 (9) ◽  
pp. 092105 ◽  
Author(s):  
E. Koren ◽  
Y. Rosenwaks ◽  
J. E. Allen ◽  
E. R. Hemesath ◽  
L. J. Lauhon
Keyword(s):  
Silicon Nanowires ◽  
Kelvin Probe Force Microscopy ◽  
Kelvin Probe ◽  
Force Microscopy ◽  
Scanning Photocurrent Microscopy

Carrier density distribution in silicon nanowires investigated by scanning thermal microscopy and Kelvin probe force microscopy

Micron ◽  
2015 ◽  
Vol 79 ◽  
pp. 93-100 ◽  
Author(s):  
Grzegorz Wielgoszewski ◽  
Piotr Pałetko ◽  
Daniel Tomaszewski ◽  
Michał Zaborowski ◽  
Grzegorz Jóźwiak ◽  
...  
Keyword(s):  
Density Distribution ◽  
Silicon Nanowires ◽  
Carrier Density ◽  
Kelvin Probe Force Microscopy ◽  
Scanning Thermal Microscopy ◽  
Kelvin Probe ◽  
Thermal Microscopy ◽  
Force Microscopy

Identifying DNA mismatches at single-nucleotide resolution by probing individual surface potentials of DNA-capped nanoparticles

Nanoscale ◽  
2018 ◽  
Vol 10 (2) ◽  
pp. 538-547 ◽  
Author(s):  
Hyungbeen Lee ◽  
Sang Won Lee ◽  
Gyudo Lee ◽  
Wonseok Lee ◽  
Kihwan Nam ◽  
...  
Keyword(s):  
Kelvin Probe Force Microscopy ◽  
Powerful Method ◽  
Kelvin Probe ◽  
Single Nucleotide ◽  
Force Microscopy ◽  
Surface Potentials ◽  
Dna Mismatches ◽  
Nucleotide Resolution ◽  
Single Nucleotide Resolution

Here, we demonstrate a powerful method to discriminate DNA mismatches at single-nucleotide resolution from 0 to 5 mismatches (χ0 to χ5) using Kelvin probe force microscopy (KPFM).

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