scholarly journals Influence of lattice symmetry on ultrasound transmission through plates with subwavelength aperture arrays

2009 ◽  
Vol 95 (5) ◽  
pp. 051906 ◽  
Author(s):  
Héctor Estrada ◽  
Pilar Candelas ◽  
Antonio Uris ◽  
Francisco Belmar ◽  
F. Javier García de Abajo ◽  
...  
Keyword(s):  
Subwavelength Aperture ◽  
Lattice Symmetry ◽  
Aperture Arrays

scholarly journals Large-Area Subwavelength Aperture Arrays Fabricated Using Nanoimprint Lithography

2008 ◽  
Vol 7 (5) ◽  
pp. 527-531 ◽  
Author(s):  
J.L. Skinner ◽  
L.L. Hunter ◽  
A.A. Talin ◽  
J. Provine ◽  
D.A. Horsley
Keyword(s):  
Nanoimprint Lithography ◽  
Large Area ◽  
Subwavelength Aperture ◽  
Aperture Arrays

Comparisons of two subwavelength aperture arrays with different lattice structure for light transmission

Optik ◽  
2013 ◽  
Vol 124 (16) ◽  
pp. 2401-2405 ◽  
Author(s):  
Nan Zhang ◽  
Peiheng Zhou ◽  
Jianliang Xie ◽  
Longjiang Deng
Keyword(s):  
Light Transmission ◽  
Lattice Structure ◽  
Subwavelength Aperture ◽  
Aperture Arrays

scholarly journals Influence of the hole filling fraction on the ultrasonic transmission through plates with subwavelength aperture arrays

2008 ◽  
Vol 93 (1) ◽  
pp. 011907 ◽  
Author(s):  
Héctor Estrada ◽  
Pilar Candelas ◽  
Antonio Uris ◽  
Francisco Belmar ◽  
Francisco Meseguer ◽  
...  
Keyword(s):  
Hole Filling ◽  
Filling Fraction ◽  
Subwavelength Aperture ◽  
Aperture Arrays

scholarly journals Terahertz magneto-plasmonics using cobalt subwavelength aperture arrays

2017 ◽  
Vol 7 (1) ◽  
Author(s):  
Barun Gupta ◽  
Shashank Pandey ◽  
Anjali Nahata ◽  
Berardi Sensale-Rodriguez ◽  
Sivaraman Guruswamy ◽  
...  
Keyword(s):  
Subwavelength Aperture ◽  
Aperture Arrays

Computer Indexing of Electron Diffraction Patterns Including the Effects of Lattice Symmetry

1977 ◽  
Vol 35 ◽  
pp. 22-23
Author(s):  
J. S. Lally ◽  
R. J. Lee
Keyword(s):  
Electron Diffraction ◽  
Zone Axis ◽  
Crystal Thickness ◽  
Double Diffraction ◽  
Automated Method ◽  
Lattice Symmetry ◽  
Intensity Calculations ◽  
Unknown Structure ◽  
Diffraction Patterns ◽  
Orientation Parameters

In the 50 year period since the discovery of electron diffraction from crystals there has been much theoretical effort devoted to the calculation of diffracted intensities as a function of crystal thickness, orientation, and structure. However, in many applications of electron diffraction what is required is a simple identification of an unknown structure when some of the shape and orientation parameters required for intensity calculations are not known. In these circumstances an automated method is needed to solve diffraction patterns obtained near crystal zone axis directions that includes the effects of systematic absences of reflections due to lattice symmetry effects and additional reflections due to double diffraction processes.Two programs have been developed to enable relatively inexperienced microscopists to identify unknown crystals from diffraction patterns. Before indexing any given electron diffraction pattern, a set of possible crystal structures must be selected for comparison against the unknown.

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