Electronic properties of nanocrystalline LaNiO3 and La0.5Sr0.5CoO3 conductive films grown on silicon substrates determined by infrared to ultraviolet reflectance spectra

2009 ◽  
Vol 94 (22) ◽  
pp. 221104 ◽  
Author(s):  
Z. G. Hu ◽  
W. W. Li ◽  
Y. W. Li ◽  
M. Zhu ◽  
Z. Q. Zhu ◽  
...  
Keyword(s):  
Electronic Properties ◽  
Reflectance Spectra ◽  
Silicon Substrates ◽  
Conductive Films ◽  
Ultraviolet Reflectance

Far-Ultraviolet Reflectance Spectra of Ionic Crystals

1971 ◽  
Vol 26 (21) ◽  
pp. 1317-1320 ◽  
Author(s):  
G. W. Rubloff ◽  
J. Freeouf ◽  
H. Fritzsche ◽  
K. Murase
Keyword(s):  
Reflectance Spectra ◽  
Ionic Crystals ◽  
Ultraviolet Reflectance ◽  
Far Ultraviolet

Electrochemical functionalization strategy for chemical vapor deposited graphene on silicon substrates: grafting, electronic properties and biosensing

2019 ◽  
Vol 30 (47) ◽  
pp. 475703
Author(s):  
Viviana Sarmiento ◽  
Mercedes Teresita Oropeza-Guzmán ◽  
Malcolm Lockett ◽  
Wenjun Chen ◽  
Seungbae Ahn ◽  
...  
Keyword(s):  
Electronic Properties ◽  
Chemical Vapor ◽  
Silicon Substrates ◽  
Chemical Vapor Deposited

scholarly journals Optical Properties of Sol-Gel Nb2O5Films with Tunable Porosity for Sensing Applications

2015 ◽  
Vol 2015 ◽  
pp. 1-8 ◽  
Author(s):  
Rosen Georgiev ◽  
Biliana Georgieva ◽  
Marina Vasileva ◽  
Petar Ivanov ◽  
Tsvetanka Babeva
Keyword(s):  
Self Assembly ◽  
Optical Constants ◽  
Sol Gel ◽  
Reflectance Spectra ◽  
Silicon Substrates ◽  
Selected Area Electron Diffraction ◽  
Sensing Applications ◽  
Transmission Electron ◽  
Evaporation Induced Self Assembly

Thin Nb2O5films with tunable porosity are deposited by the sol-gel and evaporation induced self-assembly methods using organic template Pluronic PE6100 with different molar fractions with respect to NbCl5used as a precursor for synthesis of Nb sol. Surface morphology and structure of the films are studied by Transmission Electron Microscopy and Selected Area Electron Diffraction. The optical characterization of the films is carried out through reflectance spectra measurements of the films deposited on silicon substrates and theoretical modeling in order to obtain refractive index, extinction coefficient, and thickness of the films. The overall porosity of the films and the amount of adsorbed acetone vapors in the pores are quantified by means of Bruggeman effective medium approximation using already determined optical constants. The sensing properties of the samples are studied by measuring both the reflectance spectra and room-temperature photoluminescence spectra prior to and after exposure to acetone vapors and liquid, respectively. The potential of using the studied mesoporous Nb2O5films for chemooptical sensing is demonstrated and discussed.

Vacuum-ultraviolet reflectance spectra and optical properties of nanoscale wurtzite boron nitride

1994 ◽  
Vol 50 (24) ◽  
pp. 18637-18639 ◽  
Author(s):  
Su Yixi ◽  
Ju Xin ◽  
Wei Kun ◽  
Shi Chaoshu ◽  
Han Zhengfu ◽  
...  
Keyword(s):  
Optical Properties ◽  
Boron Nitride ◽  
Vacuum Ultraviolet ◽  
Reflectance Spectra ◽  
Ultraviolet Reflectance

Hole Doping Through Indium Intercalation into Copper Phthalocyanine

2013 ◽  
Vol 802 ◽  
pp. 273-278 ◽  
Author(s):  
Anuchit Jaruvanawat ◽  
Pakorn Prajuabwan ◽  
Sunit Rojanasuwan ◽  
Annop Chanhom ◽  
Adirek Rangkasikorn ◽  
...  
Keyword(s):  
Thin Films ◽  
Electronic Properties ◽  
Photoelectron Spectroscopy ◽  
Copper Phthalocyanine ◽  
High Vacuum ◽  
Hole Transport ◽  
Hole Doping ◽  
Silicon Substrates ◽  
X Ray ◽  
Evaporation Technique

A blend of molecular acceptor and molecular donor made of Copper Phthalocyanine (CuPc) and Indium in various ratios were evaporated in high vacuum on to intrinsic silicon substrates by using vacuum thermal co-evaporation technique. Electronic properties of In-doped CuPc thin films have been examined by X-ray photoelectron spectroscopy (XPS). The results obtained by XPS suggests that In-doped CuPc is a hole transport material.

Vacuum Ultraviolet Reflectance Spectra of RDP and RDA

1985 ◽  
Vol 24 (S2) ◽  
pp. 932
Author(s):  
Setsuko Matsumoto ◽  
Masami Fujisawa ◽  
Hirofumi Namatame ◽  
Shigemasa Suga
Keyword(s):  
Vacuum Ultraviolet ◽  
Reflectance Spectra ◽  
Ultraviolet Reflectance
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