A simple atomic force microscopy calibration method for direct measurement of surface energy on nanostructured surfaces covered with molecularly thin liquid films

2009 ◽  
Vol 80 (5) ◽  
pp. 055109 ◽  
Author(s):  
Ralf Brunner ◽  
Izhak Etsion ◽  
Frank E. Talke
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Energy ◽  
Direct Measurement ◽  
Calibration Method ◽  
Liquid Films ◽  
Thin Liquid Films ◽  
Nanostructured Surfaces ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Direct measurement of transversely isotropic DNA nanotube by force–distance curve‐based atomic force microscopy

2015 ◽  
Vol 10 (10) ◽  
pp. 513-517 ◽  
Author(s):  
Zhipeng Ma ◽  
Young‐Joo Kim ◽  
Seongsu Park ◽  
Yoshikazu Hirai ◽  
Toshiyuki Tsuchiya ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Direct Measurement ◽  
Transversely Isotropic ◽  
Distance Curve ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dna Nanotube

scholarly journals Dissipation signals due to lateral tip oscillations in FM-AFM

2014 ◽  
Vol 5 ◽  
pp. 2048-2057 ◽  
Author(s):  
Michael Klocke ◽  
Dietrich E Wolf
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Energy ◽  
Unit Cell ◽  
Ionic Crystals ◽  
Force Microscopy ◽  
Normal Oscillation ◽  
Line Scan ◽  
Atomic Force ◽  
Dissipation Mechanism ◽  
Lateral Excitation

We study the coupling of lateral and normal tip oscillations and its effect on the imaging process of frequency-modulated dynamic atomic force microscopy. The coupling is induced by the interaction between tip and surface. Energy is transferred from the normal to the lateral excitation, which can be detected as damping of the cantilever oscillation. However, energy can be transferred back into the normal oscillation, if not dissipated by the usually uncontrolled mechanical damping of the lateral excitation. For certain cantilevers, this dissipation mechanism can lead to dissipation rates larger than 0.01 eV per period. The mechanism produces an atomic contrast for ionic crystals with two maxima per unit cell in a line scan.

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