Preparing spin-polarized scanning tunneling microscope probes on capped carbon nanotubes by Fe doping: A first-principles study

2009 ◽  
Vol 94 (19) ◽  
pp. 193106 ◽  
Author(s):  
Xiaolong Zou ◽  
Gang Zhou ◽  
Jia Li ◽  
Binghai Yan ◽  
Jian Wu ◽  
...  
Keyword(s):  
Carbon Nanotubes ◽  
First Principles ◽  
Scanning Tunneling Microscope ◽  
Scanning Tunneling ◽  
Fe Doping ◽  
Tunneling Microscope ◽  
First Principles Study ◽  
Spin Polarized

Local dimerization and dedimerization of C60 molecules under a tip of scanning tunneling microscope: A first-principles study

Carbon ◽  
2020 ◽  
Vol 159 ◽  
pp. 638-647 ◽  
Author(s):  
Shigeru Tsukamoto ◽  
Masato Nakaya ◽  
Vasile Caciuc ◽  
Nicolae Atodiresei ◽  
Tomonobu Nakayama
Keyword(s):  
First Principles ◽  
Scanning Tunneling Microscope ◽  
Scanning Tunneling ◽  
Tunneling Microscope ◽  
First Principles Study

Spin-Polarized Scanning Tunneling Microscopy (SPSTM)

1991 ◽  
Vol 231 ◽  
Author(s):  
R. Wiesendanger ◽  
D. Buergler ◽  
G. Tarrach ◽  
I.V. Shvets ◽  
H.-J. Guentherodt
Keyword(s):  
Scanning Tunneling Microscope ◽  
High Spatial Resolution ◽  
Atomic Scale ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Promising Technique ◽  
Polarized Electrons ◽  
Tunneling Microscope ◽  
Magnetic Structures ◽  
Spin Polarized

AbstractWe report on a novel promising technique for the investigation of magnetic structures at surfaces at high spatial resolution, ultimately down to the atomic scale. This technique is based on the observation of vacuum tunneling of spin-polarized electrons by means of a scanning tunneling microscope (STM). We discuss appropriate probe tips for the spin-polarized STM (SPSTM) and describe initial experimental results. We further focus on the information obtained by SPSTM. Finally, the perspectives of SPSTM will be discussed.

Spin-polarized electron tunneling detected using a scanning tunneling microscope

1997 ◽  
Vol 386 (1-3) ◽  
pp. 311-314 ◽  
Author(s):  
Zhanghua Wu ◽  
Tomonobu Nakayama ◽  
Makoto Sakurai ◽  
Masakazu Aono
Keyword(s):  
Scanning Tunneling Microscope ◽  
Electron Tunneling ◽  
Scanning Tunneling ◽  
Tunneling Microscope ◽  
Spin Polarized

Observation of vacuum tunneling of spin-polarized electrons with the scanning tunneling microscope

1990 ◽  
Vol 65 (2) ◽  
pp. 247-250 ◽  
Author(s):  
R. Wiesendanger ◽  
H.-J. Güntherodt ◽  
G. Güntherodt ◽  
R. J. Gambino ◽  
R. Ruf
Keyword(s):  
Scanning Tunneling Microscope ◽  
Scanning Tunneling ◽  
Polarized Electrons ◽  
Tunneling Microscope ◽  
Spin Polarized

scholarly journals First-principles theory of inelastic currents in a scanning tunneling microscope

1998 ◽  
Vol 58 (12) ◽  
pp. 8038-8041 ◽  
Author(s):  
K. Stokbro ◽  
Ben Yu-Kuang Hu ◽  
C. Thirstrup ◽  
X. C. Xie
Keyword(s):  
First Principles ◽  
Scanning Tunneling Microscope ◽  
Scanning Tunneling ◽  
Tunneling Microscope

scholarly journals A mechanism for cutting carbon nanotubes with a scanning tunneling microscope

2000 ◽  
Vol 17 (2) ◽  
pp. 301-308 ◽  
Author(s):  
A. Rubio ◽  
S.P. Apell ◽  
L.C. Venema ◽  
C. Dekker
Keyword(s):  
Carbon Nanotubes ◽  
Scanning Tunneling Microscope ◽  
Scanning Tunneling ◽  
Tunneling Microscope

NANOSCALE CHARACTERIZATION BY SCANNING TUNNELING MICROSCOPY

COSMOS ◽  
2007 ◽  
Vol 03 (01) ◽  
pp. 23-50 ◽  
Author(s):  
HAI XU ◽  
XIAN NING XIE ◽  
M. A. K. ZILANI ◽  
WEI CHEN ◽  
ANDREW THYE SHEN WEE
Keyword(s):  
Scanning Tunneling Microscope ◽  
Scanning Tunneling ◽  
Tunneling Microscopy ◽  
Preparation Methods ◽  
New Developments ◽  
Tunneling Microscope ◽  
Spin Polarized ◽  
Nanoscale Characterization ◽  
Working Principle ◽  
Operational Modes

Nanoscale characterization is a key field in nanoscience and technology as it provides fundamental understanding of the properties and functionalities of materials down to the atomic and molecular scale. In this article, we review the development and application of scanning tunneling microscope (STM) techniques in nanoscale characterization. We will discuss the working principle, experimental setup, operational modes, and tip preparation methods of scanning tunneling microscope. Selected examples are provided to illustrate the application of STM in the nanocharacterization of semiconductors. In addition, new developments in STM techniques including spin-polarized STM (SP-STM) and multi-probe STM (MP-STM) are discussed in comparison with conventional non-magnetic and single tip STM methods.

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