High sensitivity photoconductivity based measurement setup for the determination of effective recombination lifetime in silicon wafers
2009 ◽
Vol 80
(5)
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pp. 053906
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2019 ◽
Vol 85
(2)
◽
pp. 12-16
2020 ◽
Vol 23
(10)
◽
pp. 1010-1022
Keyword(s):
Keyword(s):
2017 ◽
Vol 32
(3)
◽
pp. 352-356
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