Structural, electrical, and magnetic properties of chemical solution deposited Bi(Fe0.95Cr0.05)O3 thin films on platinized silicon substrates

2009 ◽  
Vol 105 (8) ◽  
pp. 084110 ◽  
Author(s):  
N. M. Murari ◽  
R. Thomas ◽  
A. Winterman ◽  
R. E. Melgarejo ◽  
S. P. Pavunny ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Silicon Substrates ◽  
Chemical Solution ◽  
Electrical And Magnetic Properties

Structural, electrical, and magnetic properties of chemical solution deposited BiFe1−xTixO3 and BiFe0.9Ti0.05Co0.05O3 thin films

2009 ◽  
Vol 106 (1) ◽  
pp. 014103 ◽  
Author(s):  
N. M. Murari ◽  
R. Thomas ◽  
R. E. Melgarejo ◽  
S. P. Pavunny ◽  
R. S. Katiyar
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Chemical Solution ◽  
Electrical And Magnetic Properties

Percolation Effects in the Mechanical Properties of Granular Ni-A12O3 thin films

1990 ◽  
Vol 195 ◽  
Author(s):  
T.E. Schlesinger ◽  
A. Gavrin ◽  
R.C. Cammarata ◽  
C.-L. Chien
Keyword(s):  
Thin Films ◽  
Mechanical Properties ◽  
Plastic Deformation ◽  
Magnetic Properties ◽  
Percolation Threshold ◽  
Volume Fraction ◽  
Electrical And Magnetic Properties ◽  
Low Load

ABSTRACTThe mechanical properties of sputtered Ni-Al2O3 granular thin films were investigated by low load microharaness testing. It was found that the microhardness of these films displayed a percolation threshold at a nickel volume fraction of about 0.6, below which the hardness is greatly enhanced. This behavior is qualitatively similar to the electrical and magnetic properties of these types of films. A percolation threshold in hardness can be understood as due to a change in the mechanism for plastic deformation.

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